Characterizing the Effects of Single Event Upsets on Synchronous Data Paths

Name: Work Video:
Duration: 3 min 30 s
Description: We present a Single Event Upset (SEU) model with supporting data demonstrating frequency effects that deviate from conventional theory. The model emphasizes design topology versus circuit-element contributions to SEU cross sections.
Melanie D. Berg; M. Friendlich; Hak Kim; Christina M. Seidlick; Kenneth A. LaBel; Ray Ladbury; Jonathan A. Pellish
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