Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W2028816440', 'doi': 'https://doi.org/10.1002/pssc.201000508', 'title': 'Development of X‐ray diffractometer for in‐situ observation of thin‐film crystal growth equipped with focusing monochromator', 'display_name': 'Development of X‐ray diffractometer for in‐situ observation of thin‐film crystal growth equipped with focusing monochromator', 'publication_year': 2010, 'publication_date': '2010-11-08', 'ids': {'openalex': 'https://openalex.org/W2028816440', 'doi': 'https://doi.org/10.1002/pssc.201000508', 'mag': '2028816440'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1002/pssc.201000508', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4210174949', 'display_name': 'Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics', 'issn_l': '1610-1634', 'issn': ['1610-1634', '1610-1642', '1862-6351'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320595', 'host_organization_name': 'Wiley', 'host_organization_lineage': ['https://openalex.org/P4310320595'], 'host_organization_lineage_names': ['Wiley'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5008838275', 'display_name': 'Hiroshi Tameoka', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I60134161', 'display_name': 'Nagoya University', 'ror': 'https://ror.org/04chrp450', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I60134161']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Hiroshi Tameoka', 'raw_affiliation_strings': ['Department of Materials Science and Engineering, Nagoya University, Furo‐cho, Chikusa‐ku, Nagoya 464‐8603, Japan'], 'affiliations': [{'raw_affiliation_string': 'Department of Materials Science and Engineering, Nagoya University, Furo‐cho, Chikusa‐ku, Nagoya 464‐8603, Japan', 'institution_ids': ['https://openalex.org/I60134161']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5036984489', 'display_name': 'Tatsuya Kawase', 'orcid': 'https://orcid.org/0000-0003-2253-2238'}, 'institutions': [{'id': 'https://openalex.org/I60134161', 'display_name': 'Nagoya University', 'ror': 'https://ror.org/04chrp450', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I60134161']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Tatsuya Kawase', 'raw_affiliation_strings': ['Department of Materials Science and Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8603, Japan'], 'affiliations': [{'raw_affiliation_string': 'Department of Materials Science and Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8603, Japan', 'institution_ids': ['https://openalex.org/I60134161']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5051873576', 'display_name': 'Masao Tabuchi', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I60134161', 'display_name': 'Nagoya University', 'ror': 'https://ror.org/04chrp450', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I60134161']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Masao Tabuchi', 'raw_affiliation_strings': ['Venture Business Laboratory, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464?8603, Japan'], 'affiliations': [{'raw_affiliation_string': 'Venture Business Laboratory, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464?8603, Japan', 'institution_ids': ['https://openalex.org/I60134161']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5037303448', 'display_name': 'Yoshikazu Takeda', 'orcid': 'https://orcid.org/0009-0003-8175-6765'}, 'institutions': [{'id': 'https://openalex.org/I60134161', 'display_name': 'Nagoya University', 'ror': 'https://ror.org/04chrp450', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I60134161']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Yoshikazu Takeda', 'raw_affiliation_strings': ['Department of Crystalline Materials Science, Nagoya University, Furo-cho, Chikusa-ku,#N#Nagoya 464-8603,#N#Japan'], 'affiliations': [{'raw_affiliation_string': 'Department of Crystalline Materials Science, Nagoya University, Furo-cho, Chikusa-ku,#N#Nagoya 464-8603,#N#Japan', 'institution_ids': ['https://openalex.org/I60134161']}]}], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.418442, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 72, 'max': 75}, 'biblio': {'volume': '8', 'issue': '2', 'first_page': '294', 'last_page': '296'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 0.9994, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 0.9994, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11338', 'display_name': 'Electron Beam Lithography: Resolution and Applications', 'score': 0.9981, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13531', 'display_name': 'Quantum Size Effects in Metallic Nanostructures', 'score': 0.9978, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/monochromator', 'display_name': 'Monochromator', 'score': 0.89011973}, {'id': 'https://openalex.org/keywords/diffractometer', 'display_name': 'Diffractometer', 'score': 0.8876559}, {'id': 'https://openalex.org/keywords/crystal', 'display_name': 'Crystal (programming language)', 'score': 0.51814187}, {'id': 'https://openalex.org/keywords/hard-x-ray-photoemission-spectroscopy', 'display_name': 'Hard X-ray Photoemission Spectroscopy', 'score': 0.490639}], 'concepts': [{'id': 'https://openalex.org/C14112920', 'wikidata': 'https://www.wikidata.org/wiki/Q898306', 'display_name': 'Monochromator', 'level': 3, 'score': 0.89011973}, {'id': 'https://openalex.org/C39546656', 'wikidata': 'https://www.wikidata.org/wiki/Q904573', 'display_name': 'Diffractometer', 'level': 3, 'score': 0.8876559}, {'id': 'https://openalex.org/C89957378', 'wikidata': 'https://www.wikidata.org/wiki/Q164129', 'display_name': 'Reciprocal lattice', 'level': 3, 'score': 0.80762327}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.705327}, {'id': 'https://openalex.org/C191486275', 'wikidata': 'https://www.wikidata.org/wiki/Q210028', 'display_name': 'Scattering', 'level': 2, 'score': 0.66698796}, {'id': 'https://openalex.org/C2781285689', 'wikidata': 'https://www.wikidata.org/wiki/Q21921428', 'display_name': 'Crystal (programming language)', 'level': 2, 'score': 0.51814187}, {'id': 'https://openalex.org/C207114421', 'wikidata': 'https://www.wikidata.org/wiki/Q133900', 'display_name': 'Diffraction', 'level': 2, 'score': 0.49076805}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.4582038}, {'id': 'https://openalex.org/C2779328170', 'wikidata': 'https://www.wikidata.org/wiki/Q34777', 'display_name': 'X-ray', 'level': 2, 'score': 0.4563454}, {'id': 'https://openalex.org/C50515024', 'wikidata': 'https://www.wikidata.org/wiki/Q826582', 'display_name': 'X-ray crystallography', 'level': 3, 'score': 0.4518565}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.43820873}, {'id': 'https://openalex.org/C6260449', 'wikidata': 'https://www.wikidata.org/wiki/Q41364', 'display_name': 'Wavelength', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C26771246', 'wikidata': 'https://www.wikidata.org/wiki/Q321095', 'display_name': 'Scanning electron microscope', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C199360897', 'wikidata': 'https://www.wikidata.org/wiki/Q9143', 'display_name': 'Programming language', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1002/pssc.201000508', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4210174949', 'display_name': 'Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics', 'issn_l': '1610-1634', 'issn': ['1610-1634', '1610-1642', '1862-6351'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320595', 'host_organization_name': 'Wiley', 'host_organization_lineage': ['https://openalex.org/P4310320595'], 'host_organization_lineage_names': ['Wiley'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W4317739609', 'https://openalex.org/W2356727187', 'https://openalex.org/W2140157982', 'https://openalex.org/W2125010894', 'https://openalex.org/W2114534080', 'https://openalex.org/W2094633881', 'https://openalex.org/W2059444897', 'https://openalex.org/W2057737577', 'https://openalex.org/W1968657229', 'https://openalex.org/W1563882171'], 'abstract_inverted_index': {'Abstract': [0], 'X‐ray': [1, 11, 28, 59, 72, 89, 94, 107, 115, 138, 171, 176, 212], 'crystal': [2, 225], 'truncation': [3], 'rod': [4], 'scattering': [5, 30, 81, 117], 'measurement': [6, 31, 238], 'is': [7, 15, 66, 73], 'a': [8, 16, 70, 87, 123, 140, 161, 163, 168, 189, 219, 224], 'kind': [9], 'of': [10, 37, 147, 223], 'diffraction/scattering': [12], 'measurement,': [13, 63], 'which': [14], 'very': [17, 78], 'powerful': [18], 'technique': [19], 'to': [20, 75, 126, 136, 152, 185], 'analyze': [21], 'interface': [22], 'structures': [23], 'quantitatively': [24], 'and': [25, 41, 100, 151, 160, 173, 199, 234], 'non‐destructively.': [26], 'The': [27, 119, 130, 194], 'CTR': [29, 80, 116], 'can': [32, 110, 226], 'reveal': [33], 'layer': [34], 'thicknesses,': [35], 'distributions': [36], 'atoms,': [38], 'surface': [39], 'roughness,': [40], 'lattice': [42], 'constants': [43], 'at': [44, 97, 139, 179], 'an': [45, 58, 106], 'atomic‐scale.': [46], 'In': [47, 83, 183], 'our': [48], 'previous': [49], 'works,': [50], 'synchrotron': [51], 'radiation': [52], '(SR)': [53], 'has': [54], 'been': [55], 'utilized': [56, 134], 'as': [57], 'source': [60], 'for': [61, 113], 'the': [62, 77, 114, 128, 148, 157, 174, 180, 187, 206, 211, 214, 217, 230, 237], 'since': [64], 'it': [65, 235], 'generally': [67], 'considered': [68], 'that': [69, 109], 'strong': [71], 'necessary': [74], 'measure': [76], 'weak': [79], 'signal.': [82], 'this': [84], 'work,': [85], 'using': [86, 156, 205], 'conventional': [88], 'source,': [90, 213], 'i.e.,': [91], 'rotating': [92], 'anode': [93], 'generator': [95], 'operated': [96], '300': [98], 'mA': [99], '50': [101], 'kV,': [102], 'we': [103], 'successfully': [104], 'developed': [105, 232], 'diffractometer': [108], 'be': [111, 227], 'used': [112], 'measurement.': [118], 'key': [120], 'component': [121], 'was': [122, 133, 165, 177, 192, 196, 201], 'Johansson': [124, 131, 158], 'monochromator': [125, 132, 159], 'develop': [127], 'diffractometer.': [129], 'both': [135], 'focus': [137], 'sample': [141, 164], 'position': [142], '(to': [143], 'make': [144], 'divergence': [145], 'angle': [146], 'incident': [149, 170], 'X‐rays)': [150], 'monochromatize': [153], 'Cu‐Kα.': [154], 'By': [155], '2D‐detector,': [162], 'irradiated': [166], 'by': [167, 204, 229], 'diverging': [169], 'beam': [172], 'scattered': [175], 'detected': [178], 'same': [181], 'time.': [182], 'order': [184], 'suppress': [186], 'noise,': [188], 'Soller': [190, 207], 'slit': [191], 'introduced.': [193], 'noise': [195], 'greatly': [197], 'suppressed': [198], 'spectrum': [200], 'drastically': [202], 'improved': [203], 'slit.': [208], 'Without': [209], 'moving': [210], 'sample,': [215], 'nor': [216], 'detector,': [218], 'reciprocal': [220], 'space': [221], 'map': [222], 'obtained': [228], 'newly': [231], 'diffractometer,': [233], 'reduced': [236], 'time': [239], 'drastically.': [240], '(©': [241], '2011': [242], 'WILEY‐VCH': [243], 'Verlag': [244], 'GmbH': [245], '&': [246], 'Co.': [247], 'KGaA,': [248], 'Weinheim)': [249]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2028816440', 'counts_by_year': [{'year': 2018, 'cited_by_count': 2}], 'updated_date': '2024-08-15T06:13:15.404094', 'created_date': '2016-06-24'}