On the Second‐Order and Orientation Analysis of Planar Stationary Point Processes

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Duration: 3 min 30 s
Description: Abstract The paper presents a method for the second‐order analysis of point processes, and, basing on it, for their orientation analysis. For the reduced second moment measure of stationary and of stationary and isotropic point processes a new estimator is given, which has some advantages in comparison to RIPLEY's estimator. Three examples illustrate the use of the statistical techniques.
Joachim Ohser; Dietrich Stoyan
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