Publication Information

{'id': 'https://openalex.org/W2022436834', 'doi': 'https://doi.org/10.1109/eurosime.2014.6813774', 'title': 'Software reliability and its interaction with hardware reliability', 'display_name': 'Software reliability and its interaction with hardware reliability', 'publication_year': 2014, 'publication_date': '2014-04-01', 'ids': {'openalex': 'https://openalex.org/W2022436834', 'doi': 'https://doi.org/10.1109/eurosime.2014.6813774', 'mag': '2022436834'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/eurosime.2014.6813774', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5073722171', 'display_name': 'W.D. van Driel', 'orcid': 'https://orcid.org/0000-0001-8882-2508'}, 'institutions': [{'id': 'https://openalex.org/I4210122849', 'display_name': 'Philips (Netherlands)', 'ror': 'https://ror.org/02p2bgp27', 'country_code': 'NL', 'type': 'company', 'lineage': ['https://openalex.org/I4210122849']}], 'countries': ['NL'], 'is_corresponding': False, 'raw_author_name': 'W.D. van Driel', 'raw_affiliation_strings': ['Philips Lighting, High-Tech Campus, Eindhoven, The Netherlands'], 'affiliations': [{'raw_affiliation_string': 'Philips Lighting, High-Tech Campus, Eindhoven, The Netherlands', 'institution_ids': ['https://openalex.org/I4210122849']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5073832417', 'display_name': 'Maria Schuld', 'orcid': 'https://orcid.org/0000-0001-8626-168X'}, 'institutions': [], 'countries': ['NL'], 'is_corresponding': False, 'raw_author_name': 'M. Schuld', 'raw_affiliation_strings': ['CQM, Eindhoven, The Netherlands'], 'affiliations': [{'raw_affiliation_string': 'CQM, Eindhoven, The Netherlands', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5091380923', 'display_name': 'R. Wijgers', 'orcid': None}, 'institutions': [], 'countries': ['NL'], 'is_corresponding': False, 'raw_author_name': 'R. Wijgers', 'raw_affiliation_strings': ['CQM, Eindhoven, The Netherlands'], 'affiliations': [{'raw_affiliation_string': 'CQM, Eindhoven, The Netherlands', 'institution_ids': []}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5020094968', 'display_name': 'W.E.J. van Kooten', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210122849', 'display_name': 'Philips (Netherlands)', 'ror': 'https://ror.org/02p2bgp27', 'country_code': 'NL', 'type': 'company', 'lineage': ['https://openalex.org/I4210122849']}], 'countries': ['NL'], 'is_corresponding': False, 'raw_author_name': 'W.E.J. van Kooten', 'raw_affiliation_strings': ['Philips Lighting, High-Tech Campus, Eindhoven, The Netherlands'], 'affiliations': [{'raw_affiliation_string': 'Philips Lighting, High-Tech Campus, Eindhoven, The Netherlands', 'institution_ids': ['https://openalex.org/I4210122849']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.586, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 11, 'citation_normalized_percentile': {'value': 0.80019, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 86, 'max': 87}, 'biblio': {'volume': None, 'issue': None, 'first_page': '1', 'last_page': '8'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10780', 'display_name': 'Reliability and Maintenance Optimization', 'score': 0.9969, 'subfield': {'id': 'https://openalex.org/subfields/2213', 'display_name': 'Safety, Risk, Reliability and Quality'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11005', 'display_name': 'Radiation Effects in Electronics', 'score': 0.9943, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/software-reliability-testing', 'display_name': 'Software reliability testing', 'score': 0.6768982}, {'id': 'https://openalex.org/keywords/avionics-software', 'display_name': 'Avionics software', 'score': 0.5054207}, {'id': 'https://openalex.org/keywords/software-sizing', 'display_name': 'Software sizing', 'score': 0.42687052}], 'concepts': [{'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.77354866}, {'id': 'https://openalex.org/C117447612', 'wikidata': 'https://www.wikidata.org/wiki/Q1412670', 'display_name': 'Software quality', 'level': 4, 'score': 0.76094985}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.72522366}, {'id': 'https://openalex.org/C52928878', 'wikidata': 'https://www.wikidata.org/wiki/Q7554226', 'display_name': 'Software reliability testing', 'level': 5, 'score': 0.6768982}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.6672379}, {'id': 'https://openalex.org/C109905503', 'wikidata': 'https://www.wikidata.org/wiki/Q4828920', 'display_name': 'Avionics software', 'level': 5, 'score': 0.5054207}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.48763695}, {'id': 'https://openalex.org/C186846655', 'wikidata': 'https://www.wikidata.org/wiki/Q3398377', 'display_name': 'Software construction', 'level': 4, 'score': 0.43723348}, {'id': 'https://openalex.org/C48002344', 'wikidata': 'https://www.wikidata.org/wiki/Q2919644', 'display_name': 'Verification and validation', 'level': 2, 'score': 0.4347123}, {'id': 'https://openalex.org/C201515116', 'wikidata': 'https://www.wikidata.org/wiki/Q7554363', 'display_name': 'Software sizing', 'level': 5, 'score': 0.42687052}, {'id': 'https://openalex.org/C529173508', 'wikidata': 'https://www.wikidata.org/wiki/Q638608', 'display_name': 'Software development', 'level': 3, 'score': 0.39935315}, {'id': 'https://openalex.org/C115903868', 'wikidata': 'https://www.wikidata.org/wiki/Q80993', 'display_name': 'Software engineering', 'level': 1, 'score': 0.32761705}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.12610269}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.10053882}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C21547014', 'wikidata': 'https://www.wikidata.org/wiki/Q1423657', 'display_name': 'Operations management', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/eurosime.2014.6813774', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'score': 0.57, 'display_name': 'Industry, innovation and infrastructure', 'id': 'https://metadata.un.org/sdg/9'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 17, 'referenced_works': ['https://openalex.org/W130666128', 'https://openalex.org/W1819399314', 'https://openalex.org/W1968903302', 'https://openalex.org/W1982161663', 'https://openalex.org/W2024793058', 'https://openalex.org/W2032494193', 'https://openalex.org/W2050222500', 'https://openalex.org/W2137209303', 'https://openalex.org/W2145071552', 'https://openalex.org/W2150546740', 'https://openalex.org/W2153242493', 'https://openalex.org/W2160560725', 'https://openalex.org/W2165238463', 'https://openalex.org/W2170105447', 'https://openalex.org/W2171242934', 'https://openalex.org/W2357631411', 'https://openalex.org/W574011048'], 'related_works': ['https://openalex.org/W4238386252', 'https://openalex.org/W4224250221', 'https://openalex.org/W3088925126', 'https://openalex.org/W2911381409', 'https://openalex.org/W2810283397', 'https://openalex.org/W2798306226', 'https://openalex.org/W2209071826', 'https://openalex.org/W2181390869', 'https://openalex.org/W2023346118', 'https://openalex.org/W1494025131'], 'abstract_inverted_index': {'Software': [0], 'reliability': [1, 9, 20, 32, 47, 56], 'models': [2, 33], 'can': [3], 'provide': [4], 'quantitative': [5], 'measures': [6], 'of': [7, 10, 48, 57], 'the': [8, 25, 46, 55], 'software': [11, 19, 31, 49], 'systems': [12], 'during': [13], 'development': [14], 'processes.': [15], 'Research': [16], 'activities': [17], 'in': [18, 44], 'engineering': [21], 'are': [22, 34], 'conducted': [23], 'over': [24], 'past': [26], 'four': [27], 'decades,': [28], 'and': [29, 50], 'many': [30], 'proposed.': [35], 'In': [36], 'this': [37], 'paper': [38], 'we': [39], 'will': [40], 'present': [41], 'our': [42], 'results': [43], 'predicting': [45], 'how': [51], 'that': [52], 'relates': [53], 'to': [54], 'hardware.': [58]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2022436834', 'counts_by_year': [{'year': 2024, 'cited_by_count': 1}, {'year': 2021, 'cited_by_count': 2}, {'year': 2020, 'cited_by_count': 2}, {'year': 2019, 'cited_by_count': 1}, {'year': 2018, 'cited_by_count': 2}, {'year': 2017, 'cited_by_count': 2}, {'year': 2015, 'cited_by_count': 1}], 'updated_date': '2025-01-06T09:13:41.021219', 'created_date': '2016-06-24'}