Title: Mass Markers for Time-of-Flight Secondary Ion Mass Spectrometry Spectrum in a Large Mass Region Using Ir<sub>4</sub>(CO)<sub>12</sub> Metal Cluster Complex Sample
Abstract: The time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra of a metal cluster complex, Ir 4 (CO) 12 , evaporated on a Si wafer have been analyzed to clarify the origin of the mass deviation of the peaks from the true mass positions expected from the m / z values. Most of the peaks in the TOF-SIMS spectra are found to show shifts from the true positions due to the dissociation of secondary ions, i.e., release of a CO ligand, after the ionization. In conclusion, the ion peaks that can be used as mass markers of the TOF-SIMS system must be stable parent ions; such peaks are those assigned to Ir 4 (CO) 12 + ( m / z 1,100–1,108) and Ir 5 (CO) 14 + ( m / z 1,347–1,357) for positive ions, and Ir 4 (CO) 11 - ( m / z 1,072–1,080), Ir 5 (CO) 13 - ( m / z 1,319–1,329), and Ir 8 (CO) 22 - ( m / z 2,144–2,160) for negative ions with 10–50 ppm precision.
Publication Year: 2010
Publication Date: 2010-08-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 2
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