Publication Information

{'id': 'https://openalex.org/W1987411578', 'doi': 'https://doi.org/10.1080/00207217.2011.593134', 'title': 'A 2.87 ppm/°C 65 nm CMOS bandgap reference with nonlinearity compensation', 'display_name': 'A 2.87 ppm/°C 65 nm CMOS bandgap reference with nonlinearity compensation', 'publication_year': 2011, 'publication_date': '2011-08-25', 'ids': {'openalex': 'https://openalex.org/W1987411578', 'doi': 'https://doi.org/10.1080/00207217.2011.593134', 'mag': '1987411578'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1080/00207217.2011.593134', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S36304393', 'display_name': 'International Journal of Electronics', 'issn_l': '0020-7217', 'issn': ['0020-7217', '1362-3060'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320547', 'host_organization_name': 'Taylor & Francis', 'host_organization_lineage': ['https://openalex.org/P4310320547'], 'host_organization_lineage_names': ['Taylor & Francis'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5080078896', 'display_name': 'Xingyuan Tong', 'orcid': 'https://orcid.org/0000-0002-0697-1049'}, 'institutions': [{'id': 'https://openalex.org/I4210136859', 'display_name': 'Xi’an University of Posts and Telecommunications', 'ror': 'https://ror.org/04jn0td46', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I4210136859']}, {'id': 'https://openalex.org/I149594827', 'display_name': 'Xidian University', 'ror': 'https://ror.org/05s92vm98', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I149594827']}, {'id': 'https://openalex.org/I4210119392', 'display_name': 'Institute of Microelectronics', 'ror': 'https://ror.org/02s6gs133', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I19820366', 'https://openalex.org/I4210119392']}], 'countries': ['CN'], 'is_corresponding': True, 'raw_author_name': 'Tong Xingyuan', 'raw_affiliation_strings': ['Institute of Microelectronics, Xidian University , Xi’an 710071, China', "School of Electronic Engineering , Xi'an University of Posts & Telecommunications , Xi'an 710061, China"], 'affiliations': [{'raw_affiliation_string': "School of Electronic Engineering , Xi'an University of Posts & Telecommunications , Xi'an 710061, China", 'institution_ids': ['https://openalex.org/I4210136859']}, {'raw_affiliation_string': 'Institute of Microelectronics, Xidian University , Xi’an 710071, China', 'institution_ids': ['https://openalex.org/I149594827', 'https://openalex.org/I4210119392']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5039575274', 'display_name': 'Zhangming Zhu', 'orcid': 'https://orcid.org/0000-0002-7764-1928'}, 'institutions': [{'id': 'https://openalex.org/I4210119392', 'display_name': 'Institute of Microelectronics', 'ror': 'https://ror.org/02s6gs133', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I19820366', 'https://openalex.org/I4210119392']}, {'id': 'https://openalex.org/I149594827', 'display_name': 'Xidian University', 'ror': 'https://ror.org/05s92vm98', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I149594827']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Zhu Zhangming', 'raw_affiliation_strings': ['Institute of Microelectronics, Xidian University , Xi’an 710071, China'], 'affiliations': [{'raw_affiliation_string': 'Institute of Microelectronics, Xidian University , Xi’an 710071, China', 'institution_ids': ['https://openalex.org/I4210119392', 'https://openalex.org/I149594827']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5103674556', 'display_name': 'Yang Yintang', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I149594827', 'display_name': 'Xidian University', 'ror': 'https://ror.org/05s92vm98', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I149594827']}, {'id': 'https://openalex.org/I4210119392', 'display_name': 'Institute of Microelectronics', 'ror': 'https://ror.org/02s6gs133', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I19820366', 'https://openalex.org/I4210119392']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Yang Yintang', 'raw_affiliation_strings': ['Institute of Microelectronics, Xidian University , Xi’an 710071, China'], 'affiliations': [{'raw_affiliation_string': 'Institute of Microelectronics, Xidian University , Xi’an 710071, China', 'institution_ids': ['https://openalex.org/I149594827', 'https://openalex.org/I4210119392']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 3, 'corresponding_author_ids': ['https://openalex.org/A5080078896'], 'corresponding_institution_ids': ['https://openalex.org/I4210136859', 'https://openalex.org/I149594827', 'https://openalex.org/I4210119392'], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 1, 'citation_normalized_percentile': {'value': 0.430446, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 65, 'max': 72}, 'biblio': {'volume': '98', 'issue': '9', 'first_page': '1269', 'last_page': '1279'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10323', 'display_name': 'Analog and Mixed-Signal Circuit Design', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10323', 'display_name': 'Analog and Mixed-Signal Circuit Design', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10558', 'display_name': 'Advancements in Semiconductor Devices and Circuit Design', 'score': 0.9991, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11992', 'display_name': 'CCD and CMOS Imaging Sensors', 'score': 0.9985, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/bandgap-voltage-reference', 'display_name': 'Bandgap voltage reference', 'score': 0.9337999}, {'id': 'https://openalex.org/keywords/temperature-coefficient', 'display_name': 'Temperature coefficient', 'score': 0.6808264}], 'concepts': [{'id': 'https://openalex.org/C127033052', 'wikidata': 'https://www.wikidata.org/wiki/Q48635', 'display_name': 'Bandgap voltage reference', 'level': 5, 'score': 0.9337999}, {'id': 'https://openalex.org/C46362747', 'wikidata': 'https://www.wikidata.org/wiki/Q173431', 'display_name': 'CMOS', 'level': 2, 'score': 0.687902}, {'id': 'https://openalex.org/C44351266', 'wikidata': 'https://www.wikidata.org/wiki/Q1465532', 'display_name': 'Voltage reference', 'level': 3, 'score': 0.68576884}, {'id': 'https://openalex.org/C16643434', 'wikidata': 'https://www.wikidata.org/wiki/Q898642', 'display_name': 'Temperature coefficient', 'level': 2, 'score': 0.6808264}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.62163913}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.5390287}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.51710916}, {'id': 'https://openalex.org/C128624480', 'wikidata': 'https://www.wikidata.org/wiki/Q1504817', 'display_name': 'Low voltage', 'level': 3, 'score': 0.4648432}, {'id': 'https://openalex.org/C39927690', 'wikidata': 'https://www.wikidata.org/wiki/Q11197', 'display_name': 'Logarithm', 'level': 2, 'score': 0.4419042}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.38152626}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.36479017}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.22098288}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.20319009}, {'id': 'https://openalex.org/C15032970', 'wikidata': 'https://www.wikidata.org/wiki/Q851210', 'display_name': 'Dropout voltage', 'level': 4, 'score': 0.1514912}, {'id': 'https://openalex.org/C134306372', 'wikidata': 'https://www.wikidata.org/wiki/Q7754', 'display_name': 'Mathematical analysis', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1080/00207217.2011.593134', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S36304393', 'display_name': 'International Journal of Electronics', 'issn_l': '0020-7217', 'issn': ['0020-7217', '1362-3060'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320547', 'host_organization_name': 'Taylor & Francis', 'host_organization_lineage': ['https://openalex.org/P4310320547'], 'host_organization_lineage_names': ['Taylor & Francis'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'score': 0.8, 'display_name': 'Affordable and clean energy', 'id': 'https://metadata.un.org/sdg/7'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 11, 'referenced_works': ['https://openalex.org/W1504370941', 'https://openalex.org/W1997811146', 'https://openalex.org/W2028957590', 'https://openalex.org/W2112548525', 'https://openalex.org/W2130245298', 'https://openalex.org/W2141911137', 'https://openalex.org/W2152751838', 'https://openalex.org/W2164546195', 'https://openalex.org/W2288265964', 'https://openalex.org/W2540006809', 'https://openalex.org/W4240521059'], 'related_works': ['https://openalex.org/W3004564537', 'https://openalex.org/W2792398527', 'https://openalex.org/W2394281553', 'https://openalex.org/W2382539836', 'https://openalex.org/W2372270451', 'https://openalex.org/W2371305626', 'https://openalex.org/W2370976371', 'https://openalex.org/W2370820504', 'https://openalex.org/W2134241135', 'https://openalex.org/W1970992322'], 'abstract_inverted_index': {'Based': [0], 'on': [1, 49], 'the': [2, 26, 32, 37, 78, 106, 110, 138], 'review': [3], 'and': [4, 36, 77, 105], 'analysis': [5], 'of': [6, 68, 113, 130, 140], 'two': [7], 'recently': [8], 'reported': [9], 'low': [10, 91], 'temperature': [11, 20], 'coefficient': [12], '(TC)': [13], 'bandgap': [14], 'voltage': [15, 67, 80, 112], 'references': [16], '(BGRs),': [17], 'a': [18, 41, 98], 'new': [19], 'compensation': [21], 'technique': [22, 35], 'is': [23, 46, 116, 133], 'presented.': [24], 'With': [25], 'double-end': [27], 'piecewise': [28], 'nonlinearity': [29], 'correction': [30], 'method,': [31], 'logarithm': [33], 'cancellation': [34], 'mixed-mode': [38], 'output': [39, 66, 79, 111], 'topology,': [40], 'BGR': [42, 63, 93, 115, 132], 'with': [43, 72], 'high-temperature': [44], 'stability': [45], 'realised': [47], 'based': [48], '65': [50, 99], 'nm': [51, 100], 'CMOS': [52, 101], 'low-leakage': [53], 'process.': [54], 'The': [55, 128], 'post-simulation': [56], 'results': [57], 'using': [58], 'Spectre': [59], 'show': [60], 'that': [61, 109], 'this': [62, 114, 131], 'produces': [64], 'an': [65], 'about': [69, 117, 134], '953': [70], 'mV': [71, 85, 119, 123], '2.5': [73], 'V': [74], 'supply': [75], 'voltage,': [76], 'varies': [81], 'by': [82, 121], 'only': [83], '0.16': [84], 'from': [86, 124], '−40°C': [87, 125], 'to': [88, 126], '125°C.': [89, 127], 'This': [90], 'TC': [92, 129], 'has': [94], 'been': [95], 'used': [96], 'in': [97], 'touch': [102], 'screen': [103], 'controller,': [104], 'measurement': [107], 'shows': [108], '949': [118], 'varying': [120], '0.44': [122], '2.87': [135], 'ppm/°C,': [136], 'meeting': [137], 'requirement': [139], 'high-precision': [141], 'SoC': [142], 'application.': [143]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1987411578', 'counts_by_year': [{'year': 2023, 'cited_by_count': 1}], 'updated_date': '2024-12-11T20:12:51.296685', 'created_date': '2016-06-24'}