Publication Information

{'id': 'https://openalex.org/W1986672667', 'doi': 'https://doi.org/10.1143/jjap.22.297', 'title': 'Ion Sampling Study in Gaseous Plasmas Using a Simple QMF', 'display_name': 'Ion Sampling Study in Gaseous Plasmas Using a Simple QMF', 'publication_year': 1983, 'publication_date': '1983-02-01', 'ids': {'openalex': 'https://openalex.org/W1986672667', 'doi': 'https://doi.org/10.1143/jjap.22.297', 'mag': '1986672667'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1143/jjap.22.297', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S143744711', 'display_name': 'Japanese Journal of Applied Physics', 'issn_l': '0021-4922', 'issn': ['0021-4922', '1347-4065'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311669', 'host_organization_name': 'Institute of Physics', 'host_organization_lineage': ['https://openalex.org/P4310311669'], 'host_organization_lineage_names': ['Institute of Physics'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5011943104', 'display_name': 'Salah El-Kelish', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I60134161', 'display_name': 'Nagoya University', 'ror': 'https://ror.org/04chrp450', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I60134161']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Salah El-Kelish', 'raw_affiliation_strings': ['Department of Electronics, Faculty of Engineering, Nagoya University'], 'affiliations': [{'raw_affiliation_string': 'Department of Electronics, Faculty of Engineering, Nagoya University', 'institution_ids': ['https://openalex.org/I60134161']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5112179145', 'display_name': 'Yoshiyuki Uchida', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I60134161', 'display_name': 'Nagoya University', 'ror': 'https://ror.org/04chrp450', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I60134161']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Yoshiyuki Uchida', 'raw_affiliation_strings': ['Department of Electronics, Faculty of Engineering, Nagoya University'], 'affiliations': [{'raw_affiliation_string': 'Department of Electronics, Faculty of Engineering, Nagoya University', 'institution_ids': ['https://openalex.org/I60134161']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5112073639', 'display_name': 'Shūzo Hattori', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I60134161', 'display_name': 'Nagoya University', 'ror': 'https://ror.org/04chrp450', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I60134161']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Shuzo Hattori', 'raw_affiliation_strings': ['Department of Electronics, Faculty of Engineering, Nagoya University'], 'affiliations': [{'raw_affiliation_string': 'Department of Electronics, Faculty of Engineering, Nagoya University', 'institution_ids': ['https://openalex.org/I60134161']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.549, 'has_fulltext': False, 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.339627, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 62, 'max': 66}, 'biblio': {'volume': '22', 'issue': '2R', 'first_page': '297', 'last_page': '297'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10683', 'display_name': 'Mass Spectrometry Techniques and Applications', 'score': 0.9994, 'subfield': {'id': 'https://openalex.org/subfields/1607', 'display_name': 'Spectroscopy'}, 'field': {'id': 'https://openalex.org/fields/16', 'display_name': 'Chemistry'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10683', 'display_name': 'Mass Spectrometry Techniques and Applications', 'score': 0.9994, 'subfield': {'id': 'https://openalex.org/subfields/1607', 'display_name': 'Spectroscopy'}, 'field': {'id': 'https://openalex.org/fields/16', 'display_name': 'Chemistry'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10781', 'display_name': 'Plasma Diagnostics and Applications', 'score': 0.995, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10511', 'display_name': 'High voltage insulation and dielectric phenomena', 'score': 0.9886, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/torr', 'display_name': 'Torr', 'score': 0.662835}, {'id': 'https://openalex.org/keywords/ion-current', 'display_name': 'Ion current', 'score': 0.51389146}], 'concepts': [{'id': 'https://openalex.org/C145148216', 'wikidata': 'https://www.wikidata.org/wiki/Q36496', 'display_name': 'Ion', 'level': 2, 'score': 0.69969785}, {'id': 'https://openalex.org/C30646810', 'wikidata': 'https://www.wikidata.org/wiki/Q185648', 'display_name': 'Torr', 'level': 2, 'score': 0.662835}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.65476024}, {'id': 'https://openalex.org/C547737533', 'wikidata': 'https://www.wikidata.org/wiki/Q696', 'display_name': 'Argon', 'level': 2, 'score': 0.6173919}, {'id': 'https://openalex.org/C184779094', 'wikidata': 'https://www.wikidata.org/wiki/Q26383', 'display_name': 'Atomic physics', 'level': 1, 'score': 0.5296243}, {'id': 'https://openalex.org/C82706917', 'wikidata': 'https://www.wikidata.org/wiki/Q10251', 'display_name': 'Plasma', 'level': 2, 'score': 0.5206267}, {'id': 'https://openalex.org/C2778220808', 'wikidata': 'https://www.wikidata.org/wiki/Q62536', 'display_name': 'Ion current', 'level': 3, 'score': 0.51389146}, {'id': 'https://openalex.org/C113196181', 'wikidata': 'https://www.wikidata.org/wiki/Q485223', 'display_name': 'Analytical Chemistry (journal)', 'level': 2, 'score': 0.5137626}, {'id': 'https://openalex.org/C43617362', 'wikidata': 'https://www.wikidata.org/wiki/Q170050', 'display_name': 'Chromatography', 'level': 1, 'score': 0.100897014}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.09296805}, {'id': 'https://openalex.org/C178790620', 'wikidata': 'https://www.wikidata.org/wiki/Q11351', 'display_name': 'Organic chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C97355855', 'wikidata': 'https://www.wikidata.org/wiki/Q11473', 'display_name': 'Thermodynamics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1143/jjap.22.297', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S143744711', 'display_name': 'Japanese Journal of Applied Physics', 'issn_l': '0021-4922', 'issn': ['0021-4922', '1347-4065'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311669', 'host_organization_name': 'Institute of Physics', 'host_organization_lineage': ['https://openalex.org/P4310311669'], 'host_organization_lineage_names': ['Institute of Physics'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'id': 'https://metadata.un.org/sdg/6', 'score': 0.54, 'display_name': 'Clean water and sanitation'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 19, 'referenced_works': ['https://openalex.org/W1495574256', 'https://openalex.org/W1500384134', 'https://openalex.org/W1578004187', 'https://openalex.org/W1677121312', 'https://openalex.org/W2004577317', 'https://openalex.org/W2006513763', 'https://openalex.org/W2013650506', 'https://openalex.org/W2015656888', 'https://openalex.org/W2021619173', 'https://openalex.org/W2022684444', 'https://openalex.org/W2054791489', 'https://openalex.org/W2056653004', 'https://openalex.org/W2078395377', 'https://openalex.org/W2086470528', 'https://openalex.org/W2087165126', 'https://openalex.org/W2087621194', 'https://openalex.org/W2092572540', 'https://openalex.org/W2158292117', 'https://openalex.org/W2325073120'], 'related_works': ['https://openalex.org/W348572254', 'https://openalex.org/W2796236860', 'https://openalex.org/W2143903387', 'https://openalex.org/W2136084562', 'https://openalex.org/W2086930936', 'https://openalex.org/W2080111534', 'https://openalex.org/W2078490461', 'https://openalex.org/W2065159380', 'https://openalex.org/W1994061483', 'https://openalex.org/W1711931044'], 'abstract_inverted_index': {'A': [0], 'simply-constructed': [1], 'Quadrupole': [2], 'Mass': [3], 'Filter': [4], '(QMF)': [5], 'was': [6, 47, 63], 'used': [7], 'to': [8, 35, 128], 'study': [9], 'the': [10, 15, 26, 29, 36, 43, 53, 66, 72, 76, 108], 'plasma': [11], 'ionic': [12], 'constituents': [13], 'in': [14, 71], 'positive': [16, 44], 'column': [17, 45], 'of': [18, 28, 52, 75, 137], 'a': [19, 50, 94, 133], 'dc': [20], 'discharge.': [21], 'The': [22, 58, 142], 'instrumental': [23], 'calibration': [24], 'constant,': [25], 'ratio': [27, 111], 'detected': [30], 'ion': [31, 109, 143], 'current': [32, 99, 110, 135], 'I': [33, 86, 113], 'i': [34, 87], 'electron': [37, 59], 'density': [38, 60, 136], 'n': [39, 61, 89], 'e': [40, 62, 90], 'produced': [41], 'at': [42, 123], 'source,': [46], 'measured': [48, 64], 'as': [49], 'function': [51], 'discharge': [54, 77, 98, 122, 134], 'pressure': [55], 'and': [56, 88, 100, 131], 'current.': [57], 'by': [65, 152], 'floating': [67], 'double-probe': [68], 'method.': [69], 'Measurements': [70], 'low-pressure': [73], 'region': [74], 'below': [78], '2': [79, 115, 140], 'Torr': [80, 130], 'showed': [81], 'an': [82], 'approximate': [83], 'proportionality': [84], 'between': [85], ',': [91], 'except': [92], 'for': [93, 120, 132], 'slight': [95], 'dependence': [96], 'on': [97, 107], 'pressure.': [101], 'Some': [102], 'experimental': [103], 'data': [104], 'are': [105, 147], 'reported': [106], 'measurements': [112], '(Ar': [114], '+': [116, 118], ')/I(Ar': [117], ')': [119], 'argon': [121], 'pressures': [124], 'varying': [125], 'from': [126], '0.4': [127], '9': [129], '220': [138], 'mA/cm': [139], '.': [141], 'ratios': [144], 'obtained': [145, 151], 'here': [146], 'compared': [148], 'with': [149], 'those': [150], 'other': [153], 'authors.': [154]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1986672667', 'counts_by_year': [], 'updated_date': '2024-12-14T06:32:49.563912', 'created_date': '2016-06-24'}