Publication Information

{'id': 'https://openalex.org/W1984427386', 'doi': 'https://doi.org/10.1109/issrew.2013.6688917', 'title': 'Accelerated reliability testing approach for high-reliablity software based on the reinforced operational profile', 'display_name': 'Accelerated reliability testing approach for high-reliablity software based on the reinforced operational profile', 'publication_year': 2013, 'publication_date': '2013-11-01', 'ids': {'openalex': 'https://openalex.org/W1984427386', 'doi': 'https://doi.org/10.1109/issrew.2013.6688917', 'mag': '1984427386'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/issrew.2013.6688917', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4363606990', 'display_name': '2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'conference'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5100679714', 'display_name': 'Qiuying Li', 'orcid': 'https://orcid.org/0000-0002-8058-2500'}, 'institutions': [{'id': 'https://openalex.org/I82880672', 'display_name': 'Beihang University', 'ror': 'https://ror.org/00wk2mp56', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I82880672']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Qiuying Li', 'raw_affiliation_strings': ['Sch. of reliability & Syst. Eng., Beihang Univ., Beijing, China'], 'affiliations': [{'raw_affiliation_string': 'Sch. of reliability & Syst. Eng., Beihang Univ., Beijing, China', 'institution_ids': ['https://openalex.org/I82880672']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5028333740', 'display_name': 'Lei Luo', 'orcid': 'https://orcid.org/0000-0002-2312-8715'}, 'institutions': [{'id': 'https://openalex.org/I82880672', 'display_name': 'Beihang University', 'ror': 'https://ror.org/00wk2mp56', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I82880672']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Lei Luo', 'raw_affiliation_strings': ['Sch. of reliability & Syst. Eng., Beihang Univ., Beijing, China'], 'affiliations': [{'raw_affiliation_string': 'Sch. of reliability & Syst. Eng., Beihang Univ., Beijing, China', 'institution_ids': ['https://openalex.org/I82880672']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5100655213', 'display_name': 'Jian Wang', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I82880672', 'display_name': 'Beihang University', 'ror': 'https://ror.org/00wk2mp56', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I82880672']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Jian Wang', 'raw_affiliation_strings': ['Sch. of reliability & Syst. Eng., Beihang Univ., Beijing, China'], 'affiliations': [{'raw_affiliation_string': 'Sch. of reliability & Syst. Eng., Beihang Univ., Beijing, China', 'institution_ids': ['https://openalex.org/I82880672']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.802, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 4, 'citation_normalized_percentile': {'value': 0.435201, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 78, 'max': 80}, 'biblio': {'volume': None, 'issue': None, 'first_page': '337', 'last_page': '342'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10780', 'display_name': 'Reliability and Maintenance Optimization', 'score': 0.9946, 'subfield': {'id': 'https://openalex.org/subfields/2213', 'display_name': 'Safety, Risk, Reliability and Quality'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13295', 'display_name': 'Safety Systems Engineering in Autonomy', 'score': 0.9839, 'subfield': {'id': 'https://openalex.org/subfields/2213', 'display_name': 'Safety, Risk, Reliability and Quality'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/software-reliability-testing', 'display_name': 'Software reliability testing', 'score': 0.7239459}, {'id': 'https://openalex.org/keywords/software-performance-testing', 'display_name': 'Software performance testing', 'score': 0.61331755}, {'id': 'https://openalex.org/keywords/non-regression-testing', 'display_name': 'Non-regression testing', 'score': 0.58537245}, {'id': 'https://openalex.org/keywords/software-testing', 'display_name': 'Software testing', 'score': 0.5186014}, {'id': 'https://openalex.org/keywords/regression-testing', 'display_name': 'Regression testing', 'score': 0.501822}, {'id': 'https://openalex.org/keywords/test-strategy', 'display_name': 'Test strategy', 'score': 0.48172382}, {'id': 'https://openalex.org/keywords/system-testing', 'display_name': 'System testing', 'score': 0.45617625}, {'id': 'https://openalex.org/keywords/stress-testing', 'display_name': 'Stress testing (software)', 'score': 0.41727847}, {'id': 'https://openalex.org/keywords/accelerated-life-testing', 'display_name': 'Accelerated life testing', 'score': 0.41185707}, {'id': 'https://openalex.org/keywords/risk-based-testing', 'display_name': 'Risk-based testing', 'score': 0.41155586}], 'concepts': [{'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.8241972}, {'id': 'https://openalex.org/C52928878', 'wikidata': 'https://www.wikidata.org/wiki/Q7554226', 'display_name': 'Software reliability testing', 'level': 5, 'score': 0.7239459}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.7166247}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.690828}, {'id': 'https://openalex.org/C178059732', 'wikidata': 'https://www.wikidata.org/wiki/Q1982529', 'display_name': 'Software performance testing', 'level': 5, 'score': 0.61331755}, {'id': 'https://openalex.org/C86469151', 'wikidata': 'https://www.wikidata.org/wiki/Q917415', 'display_name': 'Non-regression testing', 'level': 5, 'score': 0.58537245}, {'id': 'https://openalex.org/C117447612', 'wikidata': 'https://www.wikidata.org/wiki/Q1412670', 'display_name': 'Software quality', 'level': 4, 'score': 0.5652842}, {'id': 'https://openalex.org/C2984328558', 'wikidata': 'https://www.wikidata.org/wiki/Q188522', 'display_name': 'Software testing', 'level': 3, 'score': 0.5186014}, {'id': 'https://openalex.org/C161821725', 'wikidata': 'https://www.wikidata.org/wiki/Q917415', 'display_name': 'Regression testing', 'level': 5, 'score': 0.501822}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.49879813}, {'id': 'https://openalex.org/C188598960', 'wikidata': 'https://www.wikidata.org/wiki/Q7705805', 'display_name': 'Test strategy', 'level': 3, 'score': 0.48172382}, {'id': 'https://openalex.org/C7166840', 'wikidata': 'https://www.wikidata.org/wiki/Q1199682', 'display_name': 'System testing', 'level': 2, 'score': 0.45617625}, {'id': 'https://openalex.org/C7515471', 'wikidata': 'https://www.wikidata.org/wiki/Q1936882', 'display_name': 'Stress testing (software)', 'level': 2, 'score': 0.41727847}, {'id': 'https://openalex.org/C158379689', 'wikidata': 'https://www.wikidata.org/wiki/Q3533504', 'display_name': 'Accelerated life testing', 'level': 3, 'score': 0.41185707}, {'id': 'https://openalex.org/C37945671', 'wikidata': 'https://www.wikidata.org/wiki/Q7336207', 'display_name': 'Risk-based testing', 'level': 5, 'score': 0.41155586}, {'id': 'https://openalex.org/C149091818', 'wikidata': 'https://www.wikidata.org/wiki/Q2429814', 'display_name': 'Software system', 'level': 3, 'score': 0.34572393}, {'id': 'https://openalex.org/C529173508', 'wikidata': 'https://www.wikidata.org/wiki/Q638608', 'display_name': 'Software development', 'level': 3, 'score': 0.30062068}, {'id': 'https://openalex.org/C186846655', 'wikidata': 'https://www.wikidata.org/wiki/Q3398377', 'display_name': 'Software construction', 'level': 4, 'score': 0.20040894}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.16211575}, {'id': 'https://openalex.org/C115903868', 'wikidata': 'https://www.wikidata.org/wiki/Q80993', 'display_name': 'Software engineering', 'level': 1, 'score': 0.09271914}, {'id': 'https://openalex.org/C105795698', 'wikidata': 'https://www.wikidata.org/wiki/Q12483', 'display_name': 'Statistics', 'level': 1, 'score': 0.06861374}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C199360897', 'wikidata': 'https://www.wikidata.org/wiki/Q9143', 'display_name': 'Programming language', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C173291955', 'wikidata': 'https://www.wikidata.org/wiki/Q732332', 'display_name': 'Weibull distribution', 'level': 2, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/issrew.2013.6688917', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4363606990', 'display_name': '2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'conference'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'score': 0.51, 'display_name': 'Industry, innovation and infrastructure', 'id': 'https://metadata.un.org/sdg/9'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 14, 'referenced_works': ['https://openalex.org/W1554758995', 'https://openalex.org/W1577791244', 'https://openalex.org/W1668693804', 'https://openalex.org/W1874347572', 'https://openalex.org/W1902129771', 'https://openalex.org/W2097331548', 'https://openalex.org/W2117735030', 'https://openalex.org/W2149270280', 'https://openalex.org/W2150359126', 'https://openalex.org/W2153242493', 'https://openalex.org/W2169755989', 'https://openalex.org/W2328919408', 'https://openalex.org/W2350600106', 'https://openalex.org/W2351093081'], 'related_works': ['https://openalex.org/W4248357211', 'https://openalex.org/W3214776400', 'https://openalex.org/W3197709817', 'https://openalex.org/W2886756146', 'https://openalex.org/W2386035841', 'https://openalex.org/W2362944210', 'https://openalex.org/W2296409010', 'https://openalex.org/W2113385454', 'https://openalex.org/W2063289013', 'https://openalex.org/W17857273'], 'abstract_inverted_index': {'Testing': [0], 'under': [1], 'the': [2, 66, 72, 80, 94, 109, 117, 124, 132, 137, 144, 149], 'actual': [3], 'operational': [4], 'profile': [5], '(OP)': [6], 'for': [7, 44, 57], 'high-reliability': [8], 'software': [9, 46, 58, 101], 'can': [10, 127], 'be': [11], 'expensive,': [12], 'time': [13, 135], 'consuming': [14], 'or': [15], 'even': [16], 'infeasible': [17], 'in': [18], 'situations': [19], 'where': [20], 'performance': [21], 'of': [22, 74, 82], 'a': [23, 100], 'system': [24], 'is': [25, 63, 77, 85, 91, 97], 'dominated': [26], 'by': [27], 'infrequent': [28], 'but': [29, 141], 'highly': [30], 'critical': [31, 75], 'events.': [32], 'To': [33], 'solve': [34], 'this': [35], 'problem,': [36], 'testing': [37, 49, 61, 111, 120, 134, 146], 'using': [38], 'importance': [39], 'sampling': [40], 'was': [41], 'put': [42], 'forward': [43], 'usage-based': [45], 'reliability': [47, 59], 'demonstration': [48], '(SRDT).': [50], 'An': [51], 'extended': [52], 'research': [53], 'based': [54, 69, 113, 122], 'on': [55, 70, 99, 114, 123], 'OP': [56, 68, 126], 'growth': [60, 110, 119], '(SRGT)': [62], 'proposed.': [64, 86, 92], 'Firstly,': [65], 'reinforced': [67, 125], 'changing': [71], 'probabilities': [73], 'operations': [76], 'suggested.': [78], 'Secondly,': [79], 'principle': [81], 'accelerated': [83, 95, 118], 'SRGT': [84], 'Then': [87], 'an': [88], 'implementing': [89], 'framework': [90], 'Finally,': [93], 'method': [96], 'applied': [98], 'system.': [102], 'The': [103], 'experimental': [104], 'results': [105], 'indicate:': [106], 'compared': [107], 'with': [108], 'approach': [112, 121], 'original': [115], 'OP,': [116], 'not': [128], 'only': [129], 'significantly': [130], 'decrease': [131], 'required': [133, 138], 'and': [136, 148], 'test': [139], 'cases,': [140], 'also': [142], 'obtain': [143], 'same': [145], 'conclusion': [147], 'unbiased': [150], 'estimation': [151], 'result.': [152]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1984427386', 'counts_by_year': [{'year': 2016, 'cited_by_count': 2}, {'year': 2015, 'cited_by_count': 1}, {'year': 2014, 'cited_by_count': 1}], 'updated_date': '2024-12-24T15:54:18.177827', 'created_date': '2016-06-24'}