Abstract: Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.
Publication Year: 1991
Publication Date: 1991-06-24
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 2185
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