Decoupling of geometric thickness and refractive index in quantitative phase microscopy

Name: Work Video:
Duration: 3 min 30 s
Description: In quantitative phase imaging, a priori knowledge of either refractive index or physical thickness is used to estimate the change in one of these parameters. Here, we report a method for decoupling geometric thickness from refractive index in quantitative phase microscopy.
Nelson Cardenas; Samarendra Mohanty
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