Abstract: Abstract X‐Ray diffractograms of cellophane showed a considerable variation in the intensity corresponding to the 101, 101, and 002 planes. Applications of generally accepted procedures for estimating crystalline content in cellulosic materials yields varying results for crystallimity in cellophane. It is concluded that such procedures are not applicable to cellophane used in this study.
Publication Year: 1969
Publication Date: 1969-11-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 4
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