Publication Information

{'id': 'https://openalex.org/W1961325353', 'doi': 'https://doi.org/10.1017/s1431927602104521', 'title': 'Comparison of Detection Limits for Elemental Mapping by EF-TEM and STEMXEDS', 'display_name': 'Comparison of Detection Limits for Elemental Mapping by EF-TEM and STEMXEDS', 'publication_year': 2002, 'publication_date': '2002-08-01', 'ids': {'openalex': 'https://openalex.org/W1961325353', 'doi': 'https://doi.org/10.1017/s1431927602104521', 'mag': '1961325353'}, 'language': 'en', 'primary_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.1017/s1431927602104521', 'pdf_url': 'https://www.cambridge.org/core/services/aop-cambridge-core/content/view/7CE742226EC5CB2F3DC97C6A041AC62C/S1431927602104521a.pdf/div-class-title-comparison-of-detection-limits-for-elemental-mapping-by-ef-tem-and-stemxeds-div.pdf', 'source': {'id': 'https://openalex.org/S98208149', 'display_name': 'Microscopy and Microanalysis', 'issn_l': '1431-9276', 'issn': ['1431-9276', '1435-8115'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311648', 'host_organization_name': 'Oxford University Press', 'host_organization_lineage': ['https://openalex.org/P4310311647', 'https://openalex.org/P4310311648'], 'host_organization_lineage_names': ['University of Oxford', 'Oxford University Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': True, 'oa_status': 'bronze', 'oa_url': 'https://www.cambridge.org/core/services/aop-cambridge-core/content/view/7CE742226EC5CB2F3DC97C6A041AC62C/S1431927602104521a.pdf/div-class-title-comparison-of-detection-limits-for-elemental-mapping-by-ef-tem-and-stemxeds-div.pdf', 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5102839283', 'display_name': 'Masashi Watanabe', 'orcid': 'https://orcid.org/0000-0003-1372-3972'}, 'institutions': [{'id': 'https://openalex.org/I186143895', 'display_name': 'Lehigh University', 'ror': 'https://ror.org/012afjb06', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I186143895']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Masashi Watanabe', 'raw_affiliation_strings': ['Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015 USA'], 'affiliations': [{'raw_affiliation_string': 'Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015 USA', 'institution_ids': ['https://openalex.org/I186143895']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5105308585', 'display_name': 'David B. Williams', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I186143895', 'display_name': 'Lehigh University', 'ror': 'https://ror.org/012afjb06', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I186143895']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'David B. Williams', 'raw_affiliation_strings': ['Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015 USA'], 'affiliations': [{'raw_affiliation_string': 'Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015 USA', 'institution_ids': ['https://openalex.org/I186143895']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5113821784', 'display_name': 'Yoshitsugu Tomokiyo', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I135598925', 'display_name': 'Kyushu University', 'ror': 'https://ror.org/00p4k0j84', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I135598925']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Yoshitsugu Tomokiyo', 'raw_affiliation_strings': ['Dept. of Materials Science and Engineering, Kyushu University, Fukuoka 812-8581, Japan'], 'affiliations': [{'raw_affiliation_string': 'Dept. of Materials Science and Engineering, Kyushu University, Fukuoka 812-8581, Japan', 'institution_ids': ['https://openalex.org/I135598925']}]}], 'institution_assertions': [], 'countries_distinct_count': 2, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': {'value': 3255, 'currency': 'USD', 'value_usd': 3255, 'provenance': 'doaj'}, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'pdf', 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.456029, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 64, 'max': 68}, 'biblio': {'volume': '8', 'issue': 'S02', 'first_page': '1588', 'last_page': '1589'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12039', 'display_name': 'Electron and X-Ray Spectroscopy Techniques', 'score': 0.9993, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12039', 'display_name': 'Electron and X-Ray Spectroscopy Techniques', 'score': 0.9993, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13552', 'display_name': 'Advanced Materials Characterization Techniques', 'score': 0.999, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12166', 'display_name': 'Ion-surface interactions and analysis', 'score': 0.9945, 'subfield': {'id': 'https://openalex.org/subfields/2206', 'display_name': 'Computational Mechanics'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/science-and-engineering', 'display_name': 'Science and engineering', 'score': 0.46203095}], 'concepts': [{'id': 'https://openalex.org/C161191863', 'wikidata': 'https://www.wikidata.org/wiki/Q199655', 'display_name': 'Library science', 'level': 1, 'score': 0.66567844}, {'id': 'https://openalex.org/C2993955422', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Science and engineering', 'level': 2, 'score': 0.46203095}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.41196334}, {'id': 'https://openalex.org/C52119013', 'wikidata': 'https://www.wikidata.org/wiki/Q50637', 'display_name': 'Art history', 'level': 1, 'score': 0.3469541}, {'id': 'https://openalex.org/C142362112', 'wikidata': 'https://www.wikidata.org/wiki/Q735', 'display_name': 'Art', 'level': 0, 'score': 0.32792068}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.26959598}, {'id': 'https://openalex.org/C55587333', 'wikidata': 'https://www.wikidata.org/wiki/Q1133029', 'display_name': 'Engineering ethics', 'level': 1, 'score': 0.13903007}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': True, 'landing_page_url': 'https://doi.org/10.1017/s1431927602104521', 'pdf_url': 'https://www.cambridge.org/core/services/aop-cambridge-core/content/view/7CE742226EC5CB2F3DC97C6A041AC62C/S1431927602104521a.pdf/div-class-title-comparison-of-detection-limits-for-elemental-mapping-by-ef-tem-and-stemxeds-div.pdf', 'source': {'id': 'https://openalex.org/S98208149', 'display_name': 'Microscopy and Microanalysis', 'issn_l': '1431-9276', 'issn': ['1431-9276', '1435-8115'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311648', 'host_organization_name': 'Oxford University Press', 'host_organization_lineage': ['https://openalex.org/P4310311647', 'https://openalex.org/P4310311648'], 'host_organization_lineage_names': ['University of Oxford', 'Oxford University Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}], 'best_oa_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.1017/s1431927602104521', 'pdf_url': 'https://www.cambridge.org/core/services/aop-cambridge-core/content/view/7CE742226EC5CB2F3DC97C6A041AC62C/S1431927602104521a.pdf/div-class-title-comparison-of-detection-limits-for-elemental-mapping-by-ef-tem-and-stemxeds-div.pdf', 'source': {'id': 'https://openalex.org/S98208149', 'display_name': 'Microscopy and Microanalysis', 'issn_l': '1431-9276', 'issn': ['1431-9276', '1435-8115'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311648', 'host_organization_name': 'Oxford University Press', 'host_organization_lineage': ['https://openalex.org/P4310311647', 'https://openalex.org/P4310311648'], 'host_organization_lineage_names': ['University of Oxford', 'Oxford University Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 1, 'referenced_works': ['https://openalex.org/W2572687589'], 'related_works': ['https://openalex.org/W612963211', 'https://openalex.org/W394050644', 'https://openalex.org/W2899084033', 'https://openalex.org/W2799613829', 'https://openalex.org/W2748952813', 'https://openalex.org/W2078916040', 'https://openalex.org/W1990327953', 'https://openalex.org/W1965401213', 'https://openalex.org/W169794994', 'https://openalex.org/W163049555'], 'abstract_inverted_index': {'Journal': [0], 'Article': [1], 'Comparison': [2], 'of': [3, 20, 50, 78], 'Detection': [4], 'Limits': [5], 'for': [6, 32, 62, 89], 'Elemental': [7], 'Mapping': [8], 'by': [9, 35, 65, 92], 'EF-TEM': [10], 'and': [11, 23, 53, 81, 101], 'STEMXEDS': [12], 'Get': [13], 'access': [14], 'Masashi': [15, 17], 'Watanabe,': [16], 'Watanabe': [18], 'Dept.': [19, 49, 77], 'Materials': [21, 51, 79], 'Science': [22, 52, 80], 'Engineering,': [24, 54, 82], 'Lehigh': [25, 55], 'University,': [26, 56, 84], 'Bethlehem,': [27, 57], 'PA': [28, 58], '18015': [29, 59], 'USA': [30, 60], 'Search': [31, 61, 88], 'other': [33, 63, 90], 'works': [34, 64, 91], 'this': [36, 66, 93], 'author': [37, 67, 94], 'on:': [38, 68, 95], 'Oxford': [39, 69, 96], 'Academic': [40, 70, 97], 'Google': [41, 71, 98], 'Scholar': [42, 72, 99], 'David': [43, 46], 'B': [44, 47], 'Williams,': [45], 'Williams': [48], 'Yoshitsugu': [73, 75], 'Tomokiyo': [74, 76], 'Kyushu': [83], 'Fukuoka': [85], '812-8581,': [86], 'Japan': [87], 'Microscopy': [100], 'Microanalysis,': [102], 'Volume': [103], '8,': [104], 'Issue': [105], 'S02,': [106], '1': [107], 'August': [108, 115], '2002,': [109], 'Pages': [110], '1588–1589,': [111], 'https://doi.org/10.1017/S1431927602104521': [112], 'Published:': [113], '01': [114], '2002': [116]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1961325353', 'counts_by_year': [{'year': 2012, 'cited_by_count': 1}], 'updated_date': '2024-12-12T10:11:03.157349', 'created_date': '2016-06-24'}