Publication Information

{'id': 'https://openalex.org/W1916810855', 'doi': 'https://doi.org/10.1109/rams.1984.764304', 'title': 'Controlling the reliability of software during the O&M phase', 'display_name': 'Controlling the reliability of software during the O&M phase', 'publication_year': 2005, 'publication_date': '2005-08-25', 'ids': {'openalex': 'https://openalex.org/W1916810855', 'doi': 'https://doi.org/10.1109/rams.1984.764304', 'mag': '1916810855'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/rams.1984.764304', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5084866901', 'display_name': 'James A. McCall', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210106463', 'display_name': 'System Science Applications (United States)', 'ror': 'https://ror.org/01gg29e32', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I4210106463']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'J.A. McCall', 'raw_affiliation_strings': ['Science Applications Inc.orporated, La Jolla, USA'], 'affiliations': [{'raw_affiliation_string': 'Science Applications Inc.orporated, La Jolla, USA', 'institution_ids': ['https://openalex.org/I4210106463']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5075112211', 'display_name': 'Mary Anne Herndon', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210106463', 'display_name': 'System Science Applications (United States)', 'ror': 'https://ror.org/01gg29e32', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I4210106463']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'M.A. Herndon', 'raw_affiliation_strings': ['Science Applications Inc.orporated, La Jolla, USA'], 'affiliations': [{'raw_affiliation_string': 'Science Applications Inc.orporated, La Jolla, USA', 'institution_ids': ['https://openalex.org/I4210106463']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 61}, 'biblio': {'volume': None, 'issue': None, 'first_page': '275', 'last_page': '281'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10260', 'display_name': 'Software Engineering Research', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/1710', 'display_name': 'Information Systems'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10260', 'display_name': 'Software Engineering Research', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/1710', 'display_name': 'Information Systems'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10743', 'display_name': 'Software Testing and Debugging Techniques', 'score': 0.998, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/software-quality-analyst', 'display_name': 'Software quality analyst', 'score': 0.7622727}, {'id': 'https://openalex.org/keywords/software-quality-control', 'display_name': 'Software quality control', 'score': 0.6233679}, {'id': 'https://openalex.org/keywords/software-quality-assurance', 'display_name': 'Software quality assurance', 'score': 0.5700717}, {'id': 'https://openalex.org/keywords/software-metric', 'display_name': 'Software metric', 'score': 0.47286057}, {'id': 'https://openalex.org/keywords/personal-software-process', 'display_name': 'Personal software process', 'score': 0.47086516}, {'id': 'https://openalex.org/keywords/software-peer-review', 'display_name': 'Software peer review', 'score': 0.46090257}, {'id': 'https://openalex.org/keywords/software-measurement', 'display_name': 'Software measurement', 'score': 0.45014766}, {'id': 'https://openalex.org/keywords/software-reliability-testing', 'display_name': 'Software reliability testing', 'score': 0.4174881}], 'concepts': [{'id': 'https://openalex.org/C188329197', 'wikidata': 'https://www.wikidata.org/wiki/Q6554613', 'display_name': 'Software quality analyst', 'level': 5, 'score': 0.7622727}, {'id': 'https://openalex.org/C117447612', 'wikidata': 'https://www.wikidata.org/wiki/Q1412670', 'display_name': 'Software quality', 'level': 4, 'score': 0.6796612}, {'id': 'https://openalex.org/C176035894', 'wikidata': 'https://www.wikidata.org/wiki/Q7554350', 'display_name': 'Software quality control', 'level': 5, 'score': 0.6233679}, {'id': 'https://openalex.org/C48002344', 'wikidata': 'https://www.wikidata.org/wiki/Q2919644', 'display_name': 'Verification and validation', 'level': 2, 'score': 0.5895576}, {'id': 'https://openalex.org/C2776969324', 'wikidata': 'https://www.wikidata.org/wiki/Q613918', 'display_name': 'Software quality assurance', 'level': 5, 'score': 0.5700717}, {'id': 'https://openalex.org/C186846655', 'wikidata': 'https://www.wikidata.org/wiki/Q3398377', 'display_name': 'Software construction', 'level': 4, 'score': 0.52600634}, {'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.5201383}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.5124953}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.50146174}, {'id': 'https://openalex.org/C115903868', 'wikidata': 'https://www.wikidata.org/wiki/Q80993', 'display_name': 'Software engineering', 'level': 1, 'score': 0.4948706}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.47881466}, {'id': 'https://openalex.org/C82214349', 'wikidata': 'https://www.wikidata.org/wiki/Q657339', 'display_name': 'Software metric', 'level': 5, 'score': 0.47286057}, {'id': 'https://openalex.org/C39890963', 'wikidata': 'https://www.wikidata.org/wiki/Q1702721', 'display_name': 'Personal software process', 'level': 5, 'score': 0.47086516}, {'id': 'https://openalex.org/C74579156', 'wikidata': 'https://www.wikidata.org/wiki/Q7554342', 'display_name': 'Software peer review', 'level': 5, 'score': 0.46090257}, {'id': 'https://openalex.org/C529173508', 'wikidata': 'https://www.wikidata.org/wiki/Q638608', 'display_name': 'Software development', 'level': 3, 'score': 0.4536192}, {'id': 'https://openalex.org/C89567784', 'wikidata': 'https://www.wikidata.org/wiki/Q7554325', 'display_name': 'Software measurement', 'level': 5, 'score': 0.45014766}, {'id': 'https://openalex.org/C52928878', 'wikidata': 'https://www.wikidata.org/wiki/Q7554226', 'display_name': 'Software reliability testing', 'level': 5, 'score': 0.4174881}, {'id': 'https://openalex.org/C106436119', 'wikidata': 'https://www.wikidata.org/wiki/Q836575', 'display_name': 'Quality assurance', 'level': 3, 'score': 0.41418645}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.28058636}, {'id': 'https://openalex.org/C21547014', 'wikidata': 'https://www.wikidata.org/wiki/Q1423657', 'display_name': 'Operations management', 'level': 1, 'score': 0.10022673}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.062292933}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C2778618615', 'wikidata': 'https://www.wikidata.org/wiki/Q4008393', 'display_name': 'External quality assessment', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/rams.1984.764304', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'display_name': 'Responsible consumption and production', 'id': 'https://metadata.un.org/sdg/12', 'score': 0.53}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 5, 'referenced_works': ['https://openalex.org/W1964962870', 'https://openalex.org/W1985236007', 'https://openalex.org/W1996837123', 'https://openalex.org/W2095032754', 'https://openalex.org/W3217434207'], 'related_works': ['https://openalex.org/W4246136120', 'https://openalex.org/W4230280955', 'https://openalex.org/W3137800519', 'https://openalex.org/W2810891183', 'https://openalex.org/W2306747565', 'https://openalex.org/W2215764238', 'https://openalex.org/W2105340075', 'https://openalex.org/W2101279840', 'https://openalex.org/W2095032754', 'https://openalex.org/W2006425068'], 'abstract_inverted_index': {'Software': [0], 'metrics': [1], 'have': [2], 'been': [3, 47], 'advocated': [4], 'by': [5, 92], 'the': [6, 55, 73, 76, 96], 'software': [7, 18, 21, 62, 109, 116], 'technology': [8, 53], 'community': [9], 'for': [10], 'a': [11, 30, 61, 68, 88], 'number': [12], 'of': [13, 17, 51, 60, 75, 79, 82, 90, 95, 98, 108], 'years.': [14], 'The': [15, 106], 'use': [16, 107], 'measurements': [19, 110], 'during': [20, 54, 103, 118], 'developments': [22], 'has': [23, 46, 111], 'increased': [24], 'and': [25, 32, 38, 41, 57, 85, 120], 'is': [26], 'being': [27], 'recognized': [28], 'as': [29], 'complementary': [31], 'effective': [33], 'technique': [34], 'to': [35], 'quality': [36, 99], 'assurance': [37, 100], 'independent': [39], 'verification': [40], 'validation': [42], 'organizations.': [43], 'However,': [44], 'there': [45], 'rather': [48], 'limited': [49], 'application': [50], 'this': [52], 'operation': [56], 'maintenance': [58, 93], 'phase': [59], "product's": [63], 'life': [64], 'cycle.': [65], 'In': [66], 'fact,': [67], 'recent': [69], 'study,': [70], 'conducted': [71], 'under': [72], 'sponsorship': [74], 'National': [77], 'Bureau': [78], 'Standards': [80], 'Institute': [81], 'Computer': [83], 'Science': [84], 'Technology': [86], 'indicates': [87], 'lack': [89], 'recognition': [91], 'organizations': [94], 'benefits': [97], 'or': [101], 'measurement': [102], 'their': [104], 'activities.': [105], 'significant': [112], 'potential': [113], 'in': [114], 'controlling': [115], 'reliability': [117], 'operations': [119], 'maintenance.': [121]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1916810855', 'counts_by_year': [], 'updated_date': '2024-12-15T21:56:56.525137', 'created_date': '2016-06-24'}