Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W1690023112', 'doi': 'https://doi.org/10.1002/sia.4975', 'title': 'Energy dispersive electron probe microanalysis (ED‐EPMA) of elemental composition and thickness of Fe‐Ni alloy films', 'display_name': 'Energy dispersive electron probe microanalysis (ED‐EPMA) of elemental composition and thickness of Fe‐Ni alloy films', 'publication_year': 2012, 'publication_date': '2012-04-18', 'ids': {'openalex': 'https://openalex.org/W1690023112', 'doi': 'https://doi.org/10.1002/sia.4975', 'mag': '1690023112'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1002/sia.4975', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S114406758', 'display_name': 'Surface and Interface Analysis', 'issn_l': '0142-2421', 'issn': ['0142-2421', '1096-9918'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320595', 'host_organization_name': 'Wiley', 'host_organization_lineage': ['https://openalex.org/P4310320595'], 'host_organization_lineage_names': ['Wiley'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5046982173', 'display_name': 'Vasile‐Dan Hodoroaba', 'orcid': 'https://orcid.org/0000-0002-7901-6114'}, 'institutions': [{'id': 'https://openalex.org/I1330165540', 'display_name': 'Federal Institute For Materials Research and Testing', 'ror': 'https://ror.org/03x516a66', 'country_code': 'DE', 'type': 'facility', 'lineage': ['https://openalex.org/I1330165540']}], 'countries': ['DE'], 'is_corresponding': False, 'raw_author_name': 'Vasile‐Dan Hodoroaba', 'raw_affiliation_strings': ['BAM Federal Institute for Materials Research and Testing D‐12200 Berlin Germany'], 'affiliations': [{'raw_affiliation_string': 'BAM Federal Institute for Materials Research and Testing D‐12200 Berlin Germany', 'institution_ids': ['https://openalex.org/I1330165540']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5103185378', 'display_name': 'Kyung Joong Kim', 'orcid': 'https://orcid.org/0000-0001-5559-9784'}, 'institutions': [{'id': 'https://openalex.org/I2799611809', 'display_name': 'Korea Research Institute of Standards and Science', 'ror': 'https://ror.org/01az7b475', 'country_code': 'KR', 'type': 'facility', 'lineage': ['https://openalex.org/I2799611809']}], 'countries': ['KR'], 'is_corresponding': False, 'raw_author_name': 'Kyung Joong Kim', 'raw_affiliation_strings': ['Korea Research Institute of Standards and Science (KRISS); 1 Doryong Yuseong Daejeon 305-600 Korea'], 'affiliations': [{'raw_affiliation_string': 'Korea Research Institute of Standards and Science (KRISS); 1 Doryong Yuseong Daejeon 305-600 Korea', 'institution_ids': ['https://openalex.org/I2799611809']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5073337027', 'display_name': 'Wolfgang E. S. Unger', 'orcid': 'https://orcid.org/0000-0002-7670-4042'}, 'institutions': [{'id': 'https://openalex.org/I1330165540', 'display_name': 'Federal Institute For Materials Research and Testing', 'ror': 'https://ror.org/03x516a66', 'country_code': 'DE', 'type': 'facility', 'lineage': ['https://openalex.org/I1330165540']}], 'countries': ['DE'], 'is_corresponding': False, 'raw_author_name': 'Wolfgang E. S. Unger', 'raw_affiliation_strings': ['BAM Federal Institute for Materials Research and Testing D‐12200 Berlin Germany'], 'affiliations': [{'raw_affiliation_string': 'BAM Federal Institute for Materials Research and Testing D‐12200 Berlin Germany', 'institution_ids': ['https://openalex.org/I1330165540']}]}], 'institution_assertions': [], 'countries_distinct_count': 2, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': {'value': 3350, 'currency': 'USD', 'value_usd': 3350, 'provenance': 'doaj'}, 'apc_paid': None, 'fwci': 1.163, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 27, 'citation_normalized_percentile': {'value': 0.999669, 'is_in_top_1_percent': True, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 92, 'max': 93}, 'biblio': {'volume': '44', 'issue': '11-12', 'first_page': '1459', 'last_page': '1461'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 0.9998, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 0.9998, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13552', 'display_name': 'Atom Probe Tomography Research', 'score': 0.9991, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12166', 'display_name': 'Ion Beam Surface Analysis and Nanoscale Patterning', 'score': 0.9966, 'subfield': {'id': 'https://openalex.org/subfields/2206', 'display_name': 'Computational Mechanics'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/microanalysis', 'display_name': 'Microanalysis', 'score': 0.85246605}, {'id': 'https://openalex.org/keywords/electron-probe-microanalysis', 'display_name': 'Electron probe microanalysis', 'score': 0.8314583}, {'id': 'https://openalex.org/keywords/environmental-scanning-electron-microscopy', 'display_name': 'Environmental Scanning Electron Microscopy', 'score': 0.543083}, {'id': 'https://openalex.org/keywords/scanning-electron-microscopy', 'display_name': 'Scanning Electron Microscopy', 'score': 0.525268}, {'id': 'https://openalex.org/keywords/nanomaterials-characterization', 'display_name': 'Nanomaterials Characterization', 'score': 0.503197}, {'id': 'https://openalex.org/keywords/ambient-pressure-photoelectron-spectroscopy', 'display_name': 'Ambient Pressure Photoelectron Spectroscopy', 'score': 0.502439}, {'id': 'https://openalex.org/keywords/surface-analysis', 'display_name': 'Surface Analysis', 'score': 0.500173}], 'concepts': [{'id': 'https://openalex.org/C138411078', 'wikidata': 'https://www.wikidata.org/wiki/Q911272', 'display_name': 'Electron microprobe', 'level': 2, 'score': 0.8557447}, {'id': 'https://openalex.org/C31033462', 'wikidata': 'https://www.wikidata.org/wiki/Q3058182', 'display_name': 'Microanalysis', 'level': 2, 'score': 0.85246605}, {'id': 'https://openalex.org/C2909214062', 'wikidata': 'https://www.wikidata.org/wiki/Q911272', 'display_name': 'Electron probe microanalysis', 'level': 3, 'score': 0.8314583}, {'id': 'https://openalex.org/C2780026712', 'wikidata': 'https://www.wikidata.org/wiki/Q37756', 'display_name': 'Alloy', 'level': 2, 'score': 0.76043373}, {'id': 'https://openalex.org/C544956773', 'wikidata': 'https://www.wikidata.org/wiki/Q670', 'display_name': 'Silicon', 'level': 2, 'score': 0.59225947}, {'id': 'https://openalex.org/C113196181', 'wikidata': 'https://www.wikidata.org/wiki/Q485223', 'display_name': 'Analytical Chemistry (journal)', 'level': 2, 'score': 0.5320797}, {'id': 'https://openalex.org/C40231798', 'wikidata': 'https://www.wikidata.org/wiki/Q1333743', 'display_name': 'Composition (language)', 'level': 2, 'score': 0.51288533}, {'id': 'https://openalex.org/C64885871', 'wikidata': 'https://www.wikidata.org/wiki/Q2533665', 'display_name': 'Elemental analysis', 'level': 2, 'score': 0.46898228}, {'id': 'https://openalex.org/C2779227376', 'wikidata': 'https://www.wikidata.org/wiki/Q6505497', 'display_name': 'Layer (electronics)', 'level': 2, 'score': 0.45870838}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.3935728}, {'id': 'https://openalex.org/C191897082', 'wikidata': 'https://www.wikidata.org/wiki/Q11467', 'display_name': 'Metallurgy', 'level': 1, 'score': 0.3637749}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.35051322}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.13093755}, {'id': 'https://openalex.org/C179104552', 'wikidata': 'https://www.wikidata.org/wiki/Q11165', 'display_name': 'Inorganic chemistry', 'level': 1, 'score': 0.115668535}, {'id': 'https://openalex.org/C107872376', 'wikidata': 'https://www.wikidata.org/wiki/Q321355', 'display_name': 'Environmental chemistry', 'level': 1, 'score': 0.10229012}, {'id': 'https://openalex.org/C41895202', 'wikidata': 'https://www.wikidata.org/wiki/Q8162', 'display_name': 'Linguistics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C138885662', 'wikidata': 'https://www.wikidata.org/wiki/Q5891', 'display_name': 'Philosophy', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C178790620', 'wikidata': 'https://www.wikidata.org/wiki/Q11351', 'display_name': 'Organic chemistry', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1002/sia.4975', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S114406758', 'display_name': 'Surface and Interface Analysis', 'issn_l': '0142-2421', 'issn': ['0142-2421', '1096-9918'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320595', 'host_organization_name': 'Wiley', 'host_organization_lineage': ['https://openalex.org/P4310320595'], 'host_organization_lineage_names': ['Wiley'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 5, 'referenced_works': ['https://openalex.org/W1990063163', 'https://openalex.org/W2007658104', 'https://openalex.org/W2080224872', 'https://openalex.org/W2169656384', 'https://openalex.org/W267837023'], 'related_works': ['https://openalex.org/W4230889496', 'https://openalex.org/W3038580443', 'https://openalex.org/W2388228376', 'https://openalex.org/W2128900522', 'https://openalex.org/W2088017951', 'https://openalex.org/W2064656286', 'https://openalex.org/W2058209467', 'https://openalex.org/W2023323293', 'https://openalex.org/W2016202701', 'https://openalex.org/W109292992'], 'abstract_inverted_index': {'The': [0, 27], 'elemental': [1], 'composition': [2], 'of': [3, 31, 39, 45, 53], 'thin': [4], 'Fe‐Ni': [5], 'alloy': [6], 'films': [7], 'deposited': [8], 'on': [9], 'silicon': [10], 'substrates': [11], 'were': [12], 'determined': [13], 'by': [14], 'electron': [15], 'probe': [16], 'microanalysis': [17], 'with': [18], 'an': [19], 'energy': [20], 'dispersive': [21], 'spectrometer': [22], 'using': [23], 'the': [24, 37, 51, 54, 63, 71], 'STRATAGem': [25], 'software.': [26], 'work': [28], 'was': [29], 'part': [30], 'ample': [32], 'inter‐laboratory': [33], 'comparisons': [34], 'organized': [35], 'in': [36, 59], 'frame': [38], 'CCQM/SAWG': [40], '(Consultative': [41], 'Committee': [42], 'for': [43], 'Amount': [44], 'Substance/Surface': [46], 'Analysis': [47], 'Working': [48], 'Group).': [49], 'Therefore,': [50], 'evaluation': [52], 'measurement': [55], 'uncertainties': [56], 'is': [57], 'treated': [58], 'detail.': [60], 'By': [61], 'having': [62], 'mass': [64], 'coverage': [65], 'and': [66], 'estimating': [67], 'a': [68], 'layer': [69, 72], 'density,': [70], 'thickness': [73], 'could': [74], 'be': [75], 'derived.': [76], 'Copyright': [77], '©': [78], '2012': [79], 'John': [80], 'Wiley': [81], '&': [82], 'Sons,': [83], 'Ltd.': [84]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1690023112', 'counts_by_year': [{'year': 2024, 'cited_by_count': 2}, {'year': 2023, 'cited_by_count': 1}, {'year': 2022, 'cited_by_count': 2}, {'year': 2021, 'cited_by_count': 4}, {'year': 2020, 'cited_by_count': 2}, {'year': 2019, 'cited_by_count': 4}, {'year': 2018, 'cited_by_count': 3}, {'year': 2017, 'cited_by_count': 1}, {'year': 2016, 'cited_by_count': 1}, {'year': 2015, 'cited_by_count': 1}, {'year': 2014, 'cited_by_count': 4}, {'year': 2013, 'cited_by_count': 1}, {'year': 2012, 'cited_by_count': 1}], 'updated_date': '2024-09-16T21:49:40.894213', 'created_date': '2016-06-24'}