Title: Characterization of Magnetic Nanoparticles Using Magnetic Force Microscopy
Abstract: Abstract The sections in this article are Introduction Development of MFM Comparison of MFM to Other Techniques Invasive Imaging Noninvasive Imaging Magnetic Resonance Force Microscopy Physical Principals of MFM Static Mode Dynamic Mode Forces Due to Magnetic Interaction Noise in MFM Thermal Noise Magnetic Versus Topographic Signals MFM Cantilevers and Probes Wire Probes Thin‐Film‐Coated Si Probes FIB Probes CNT Probes Probe Calibration Quantitative Calibration of the Magnetic Force Microscope Probe Calibration Samples Resolution in MFM Lateral Resolution Vertical Resolution MFM for Magnetic Nanoparticles Ferromagnetic Nanoparticles Superparamagnetic or Paramagnetic Nanoparticles The Application of MFM in the Life Sciences Limitations in MFM Recent Developments in MFM Non‐Optical Methods for Cantilever Detection Application of External Magnetic Fields Technique Developments for MFM Summary and Future Perspectives
Publication Year: 2009
Publication Date: 2009-08-12
Language: en
Type: other
Indexed In: ['crossref']
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Cited By Count: 4
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