Publication Information

{'id': 'https://openalex.org/W1538899324', 'doi': 'https://doi.org/10.1109/ted.2015.2463713', 'title': 'Demonstration of Field- and Power-Dependent ESD Failure in AlGaN/GaN RF HEMTs', 'display_name': 'Demonstration of Field- and Power-Dependent ESD Failure in AlGaN/GaN RF HEMTs', 'publication_year': 2015, 'publication_date': '2015-08-19', 'ids': {'openalex': 'https://openalex.org/W1538899324', 'doi': 'https://doi.org/10.1109/ted.2015.2463713', 'mag': '1538899324'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/ted.2015.2463713', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S162355128', 'display_name': 'IEEE Transactions on Electron Devices', 'issn_l': '0018-9383', 'issn': ['0018-9383', '1557-9646'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5085031554', 'display_name': 'Isabella Rossetto', 'orcid': 'https://orcid.org/0000-0002-9397-6146'}, 'institutions': [{'id': 'https://openalex.org/I138689650', 'display_name': 'University of Padua', 'ror': 'https://ror.org/00240q980', 'country_code': 'IT', 'type': 'education', 'lineage': ['https://openalex.org/I138689650']}], 'countries': ['IT'], 'is_corresponding': False, 'raw_author_name': 'Isabella Rossetto', 'raw_affiliation_strings': ['Department of Information Engineering, University of Padua, Padua - Italy'], 'affiliations': [{'raw_affiliation_string': 'Department of Information Engineering, University of Padua, Padua - Italy', 'institution_ids': ['https://openalex.org/I138689650']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5059611177', 'display_name': 'Matteo Meneghini', 'orcid': 'https://orcid.org/0000-0003-2421-505X'}, 'institutions': [{'id': 'https://openalex.org/I138689650', 'display_name': 'University of Padua', 'ror': 'https://ror.org/00240q980', 'country_code': 'IT', 'type': 'education', 'lineage': ['https://openalex.org/I138689650']}], 'countries': ['IT'], 'is_corresponding': False, 'raw_author_name': 'Matteo Meneghini', 'raw_affiliation_strings': ['Department of Information Engineering, University of Padua, Padua - Italy'], 'affiliations': [{'raw_affiliation_string': 'Department of Information Engineering, University of Padua, Padua - Italy', 'institution_ids': ['https://openalex.org/I138689650']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5021496016', 'display_name': 'Marco Barbato', 'orcid': 'https://orcid.org/0000-0002-5985-8189'}, 'institutions': [{'id': 'https://openalex.org/I138689650', 'display_name': 'University of Padua', 'ror': 'https://ror.org/00240q980', 'country_code': 'IT', 'type': 'education', 'lineage': ['https://openalex.org/I138689650']}], 'countries': ['IT'], 'is_corresponding': False, 'raw_author_name': 'Marco Barbato', 'raw_affiliation_strings': ['Department of Information Engineering, University of Padua, Padua - Italy'], 'affiliations': [{'raw_affiliation_string': 'Department of Information Engineering, University of Padua, Padua - Italy', 'institution_ids': ['https://openalex.org/I138689650']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5033707390', 'display_name': 'Fabiana Rampazzo', 'orcid': 'https://orcid.org/0000-0002-2418-4831'}, 'institutions': [{'id': 'https://openalex.org/I138689650', 'display_name': 'University of Padua', 'ror': 'https://ror.org/00240q980', 'country_code': 'IT', 'type': 'education', 'lineage': ['https://openalex.org/I138689650']}], 'countries': ['IT'], 'is_corresponding': False, 'raw_author_name': 'Fabiana Rampazzo', 'raw_affiliation_strings': ['Department of Information Engineering, University of Padua, Padua - Italy'], 'affiliations': [{'raw_affiliation_string': 'Department of Information Engineering, University of Padua, Padua - Italy', 'institution_ids': ['https://openalex.org/I138689650']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5056071536', 'display_name': 'Denis Marcon', 'orcid': 'https://orcid.org/0000-0002-2211-9198'}, 'institutions': [{'id': 'https://openalex.org/I4210114974', 'display_name': 'IMEC', 'ror': 'https://ror.org/02kcbn207', 'country_code': 'BE', 'type': 'nonprofit', 'lineage': ['https://openalex.org/I4210114974']}], 'countries': ['BE'], 'is_corresponding': False, 'raw_author_name': 'Denis Marcon', 'raw_affiliation_strings': ['IMEC, Leuven, Belgium,'], 'affiliations': [{'raw_affiliation_string': 'IMEC, Leuven, Belgium,', 'institution_ids': ['https://openalex.org/I4210114974']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5101587480', 'display_name': 'Gaudenzio Meneghesso', 'orcid': 'https://orcid.org/0000-0002-6715-4827'}, 'institutions': [{'id': 'https://openalex.org/I138689650', 'display_name': 'University of Padua', 'ror': 'https://ror.org/00240q980', 'country_code': 'IT', 'type': 'education', 'lineage': ['https://openalex.org/I138689650']}], 'countries': ['IT'], 'is_corresponding': False, 'raw_author_name': 'Gaudenzio Meneghesso', 'raw_affiliation_strings': ['Department of Information Engineering, University of Padua, Padua - Italy'], 'affiliations': [{'raw_affiliation_string': 'Department of Information Engineering, University of Padua, Padua - Italy', 'institution_ids': ['https://openalex.org/I138689650']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5002653396', 'display_name': 'E. Zanoni', 'orcid': 'https://orcid.org/0000-0001-7349-9656'}, 'institutions': [{'id': 'https://openalex.org/I138689650', 'display_name': 'University of Padua', 'ror': 'https://ror.org/00240q980', 'country_code': 'IT', 'type': 'education', 'lineage': ['https://openalex.org/I138689650']}], 'countries': ['IT'], 'is_corresponding': False, 'raw_author_name': 'Enrico Zanoni', 'raw_affiliation_strings': ['Department of Information Engineering, University of Padua, Padua - Italy'], 'affiliations': [{'raw_affiliation_string': 'Department of Information Engineering, University of Padua, Padua - Italy', 'institution_ids': ['https://openalex.org/I138689650']}]}], 'institution_assertions': [], 'countries_distinct_count': 2, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.982, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 34, 'citation_normalized_percentile': {'value': 0.837623, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 94, 'max': 95}, 'biblio': {'volume': '62', 'issue': '9', 'first_page': '2830', 'last_page': '2836'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12495', 'display_name': 'Electrostatic Discharge in Electronics', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12495', 'display_name': 'Electrostatic Discharge in Electronics', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 0.9995, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10099', 'display_name': 'GaN-based semiconductor devices and materials', 'score': 0.9995, 'subfield': {'id': 'https://openalex.org/subfields/3104', 'display_name': 'Condensed Matter Physics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/wide-bandgap-semiconductor', 'display_name': 'Wide-bandgap semiconductor', 'score': 0.5748144}, {'id': 'https://openalex.org/keywords/robustness', 'display_name': 'Robustness', 'score': 0.5646063}, {'id': 'https://openalex.org/keywords/snapback', 'display_name': 'Snapback', 'score': 0.54153883}, {'id': 'https://openalex.org/keywords/failure-mechanism', 'display_name': 'Failure mechanism', 'score': 0.44327208}], 'concepts': [{'id': 'https://openalex.org/C205483674', 'wikidata': 'https://www.wikidata.org/wiki/Q3574961', 'display_name': 'Electrostatic discharge', 'level': 3, 'score': 0.909011}, {'id': 'https://openalex.org/C2778871202', 'wikidata': 'https://www.wikidata.org/wiki/Q411713', 'display_name': 'Gallium nitride', 'level': 3, 'score': 0.77515054}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.7373481}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.6244159}, {'id': 'https://openalex.org/C189278905', 'wikidata': 'https://www.wikidata.org/wiki/Q2157708', 'display_name': 'Wide-bandgap semiconductor', 'level': 2, 'score': 0.5748144}, {'id': 'https://openalex.org/C63479239', 'wikidata': 'https://www.wikidata.org/wiki/Q7353546', 'display_name': 'Robustness (evolution)', 'level': 3, 'score': 0.5646063}, {'id': 'https://openalex.org/C172385210', 'wikidata': 'https://www.wikidata.org/wiki/Q5339', 'display_name': 'Transistor', 'level': 3, 'score': 0.5445672}, {'id': 'https://openalex.org/C2779888857', 'wikidata': 'https://www.wikidata.org/wiki/Q18378810', 'display_name': 'Snapback', 'level': 4, 'score': 0.54153883}, {'id': 'https://openalex.org/C129014197', 'wikidata': 'https://www.wikidata.org/wiki/Q906544', 'display_name': 'Power semiconductor device', 'level': 3, 'score': 0.47331393}, {'id': 'https://openalex.org/C119321828', 'wikidata': 'https://www.wikidata.org/wiki/Q1267190', 'display_name': 'Breakdown voltage', 'level': 3, 'score': 0.44338387}, {'id': 'https://openalex.org/C3018344627', 'wikidata': 'https://www.wikidata.org/wiki/Q1925224', 'display_name': 'Failure mechanism', 'level': 2, 'score': 0.44327208}, {'id': 'https://openalex.org/C162057924', 'wikidata': 'https://www.wikidata.org/wiki/Q1617706', 'display_name': 'High-electron-mobility transistor', 'level': 4, 'score': 0.4429657}, {'id': 'https://openalex.org/C195370968', 'wikidata': 'https://www.wikidata.org/wiki/Q1754002', 'display_name': 'Threshold voltage', 'level': 4, 'score': 0.4382221}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.41973716}, {'id': 'https://openalex.org/C60799052', 'wikidata': 'https://www.wikidata.org/wiki/Q46221', 'display_name': 'Electric field', 'level': 2, 'score': 0.41389513}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.34858668}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.3367269}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.18159306}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.17152092}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.12986302}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.09067279}, {'id': 'https://openalex.org/C55493867', 'wikidata': 'https://www.wikidata.org/wiki/Q7094', 'display_name': 'Biochemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C2779227376', 'wikidata': 'https://www.wikidata.org/wiki/Q6505497', 'display_name': 'Layer (electronics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C104317684', 'wikidata': 'https://www.wikidata.org/wiki/Q7187', 'display_name': 'Gene', 'level': 2, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/ted.2015.2463713', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S162355128', 'display_name': 'IEEE Transactions on Electron Devices', 'issn_l': '0018-9383', 'issn': ['0018-9383', '1557-9646'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'id': 'https://metadata.un.org/sdg/7', 'display_name': 'Affordable and clean energy', 'score': 0.64}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 23, 'referenced_works': ['https://openalex.org/W1490392587', 'https://openalex.org/W1543631479', 'https://openalex.org/W1978978612', 'https://openalex.org/W2004915221', 'https://openalex.org/W2009841345', 'https://openalex.org/W2012406704', 'https://openalex.org/W2013042160', 'https://openalex.org/W2016458598', 'https://openalex.org/W2022160932', 'https://openalex.org/W2036492122', 'https://openalex.org/W2078140036', 'https://openalex.org/W2082022477', 'https://openalex.org/W2085732954', 'https://openalex.org/W2087622169', 'https://openalex.org/W2118956359', 'https://openalex.org/W2133295877', 'https://openalex.org/W2156602059', 'https://openalex.org/W2160717636', 'https://openalex.org/W2576561028', 'https://openalex.org/W4237103645', 'https://openalex.org/W4245420099', 'https://openalex.org/W4298033106', 'https://openalex.org/W626220299'], 'related_works': ['https://openalex.org/W4200366585', 'https://openalex.org/W3178603963', 'https://openalex.org/W3135688849', 'https://openalex.org/W3133008552', 'https://openalex.org/W3089241959', 'https://openalex.org/W2770290499', 'https://openalex.org/W2151207161', 'https://openalex.org/W2097247147', 'https://openalex.org/W1995196027', 'https://openalex.org/W1538899324'], 'abstract_inverted_index': {'This': [0], 'paper': [1], 'reports': [2], 'an': [3], 'extensive': [4], 'analysis': [5], 'of': [6, 13, 18, 100, 118, 128, 152], 'the': [7, 14, 32, 42, 53, 59, 75, 85, 97, 101, 103, 116, 119, 125, 129, 133, 153], 'electrostatic': [8], 'discharge': [9], '(ESD)': [10], 'robustness': [11], 'and': [12, 62, 114, 136], 'corresponding': [15], 'failure': [16, 47, 54, 104, 108, 134, 154], 'mechanisms': [17], 'AlGaN/gallium': [19], 'nitride': [20], 'high-electron': [21], 'mobility': [22], 'transistors.': [23], 'Based': [24], 'on': [25, 58], 'transmission': [26], 'line': [27], 'pulse': [28], 'testing,': [29], 'we': [30], 'demonstrate': [31], 'following': [33], 'results:': [34], '1)': [35], 'when': [36, 69], 'ESD': [37, 70, 86, 98, 126], 'pulses': [38, 71], 'are': [39, 72], 'applied': [40, 73], 'to': [41, 65, 74, 147], 'drain': [43, 76], 'under': [44, 77], 'pinchoff': [45], 'conditions,': [46, 79], 'occurs': [48], 'through': [49], 'a': [50, 80, 149], 'field-dependent': [51], 'mechanism;': [52], 'voltage': [55], 'is': [56, 109], 'independent': [57], 'gate': [60], 'bias,': [61], 'approximately': [63], 'equal': [64], '300': [66], 'V;': [67, 113], '2)': [68], 'ON-state': [78], 'power-dependent': [81], 'mechanism': [82], 'prevails,': [83], 'lowering': [84], 'robustness;': [87], '3)': [88], 'vertical': [89, 107], '(drain': [90], 'substrate)': [91], 'breakdown': [92], 'does': [93], 'not': [94], 'significantly': [95, 123], 'affect': [96], 'stability': [99], 'devices;': [102], 'threshold': [105, 135], 'for': [106], 'higher': [110], 'than': [111], '450': [112], '4)': [115], 'length': [117], 'field': [120], 'plate': [121], 'can': [122], 'impact': [124], 'behavior': [127], 'devices,': [130], 'by': [131, 137], 'influencing': [132], 'favoring': [138], 'soft-degradation': [139], 'processes.': [140, 155], 'Scanning': [141], 'electron': [142], 'microscopy': [143], 'was': [144], 'extensively': [145], 'used': [146], 'achieve': [148], 'complete': [150], 'description': [151]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1538899324', 'counts_by_year': [{'year': 2024, 'cited_by_count': 2}, {'year': 2023, 'cited_by_count': 7}, {'year': 2022, 'cited_by_count': 6}, {'year': 2021, 'cited_by_count': 5}, {'year': 2020, 'cited_by_count': 4}, {'year': 2019, 'cited_by_count': 3}, {'year': 2017, 'cited_by_count': 6}, {'year': 2016, 'cited_by_count': 1}], 'updated_date': '2025-01-10T01:07:30.779372', 'created_date': '2016-06-24'}