Publication Information

{'id': 'https://openalex.org/W1537174958', 'doi': 'https://doi.org/10.1109/ivmc.1995.487101', 'title': 'Performance of the trial scanning atom-probe-new approach to evaluate micro-tip array', 'display_name': 'Performance of the trial scanning atom-probe-new approach to evaluate micro-tip array', 'publication_year': 2002, 'publication_date': '2002-11-19', 'ids': {'openalex': 'https://openalex.org/W1537174958', 'doi': 'https://doi.org/10.1109/ivmc.1995.487101', 'mag': '1537174958'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/ivmc.1995.487101', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5084119648', 'display_name': 'Osamu Nishikawa', 'orcid': 'https://orcid.org/0000-0002-8062-4993'}, 'institutions': [{'id': 'https://openalex.org/I182069643', 'display_name': 'Kanagawa Institute of Technology', 'ror': 'https://ror.org/007gj5v75', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I182069643']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'O. Nishikawa', 'raw_affiliation_strings': ['Department of Materials Science and Engineering, Kanagawa Institute of Technology, Kanazawa, Ishikawa, Japan'], 'affiliations': [{'raw_affiliation_string': 'Department of Materials Science and Engineering, Kanagawa Institute of Technology, Kanazawa, Ishikawa, Japan', 'institution_ids': ['https://openalex.org/I182069643']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5111252893', 'display_name': 'M. Iwatsuki', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'M. Iwatsuki', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5089774555', 'display_name': 'Susumu Aoki', 'orcid': 'https://orcid.org/0009-0004-0631-4606'}, 'institutions': [{'id': 'https://openalex.org/I129923673', 'display_name': 'JEOL (Japan)', 'ror': 'https://ror.org/02zme4e72', 'country_code': 'JP', 'type': 'company', 'lineage': ['https://openalex.org/I129923673']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'S. Aoki', 'raw_affiliation_strings': ['Research & Development Department Electron Optic Division, JEOL Limited, Tokyo, Japan'], 'affiliations': [{'raw_affiliation_string': 'Research & Development Department Electron Optic Division, JEOL Limited, Tokyo, Japan', 'institution_ids': ['https://openalex.org/I129923673']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5033842533', 'display_name': 'Y. Ishikaswa', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Y. Ishikaswa', 'raw_affiliation_strings': [], 'affiliations': []}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 57}, 'biblio': {'volume': None, 'issue': None, 'first_page': '509', 'last_page': '511'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T13552', 'display_name': 'Advanced Materials Characterization Techniques', 'score': 0.9998, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T13552', 'display_name': 'Advanced Materials Characterization Techniques', 'score': 0.9998, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 0.9979, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12588', 'display_name': 'Electronic and Structural Properties of Oxides', 'score': 0.9898, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/scanning-probe-microscopy', 'display_name': 'Scanning Probe Microscopy', 'score': 0.53388375}, {'id': 'https://openalex.org/keywords/atom-probe', 'display_name': 'Atom probe', 'score': 0.5296896}], 'concepts': [{'id': 'https://openalex.org/C26771246', 'wikidata': 'https://www.wikidata.org/wiki/Q321095', 'display_name': 'Scanning electron microscope', 'level': 2, 'score': 0.84259963}, {'id': 'https://openalex.org/C6518042', 'wikidata': 'https://www.wikidata.org/wiki/Q175646', 'display_name': 'Scanning tunneling microscope', 'level': 2, 'score': 0.8281909}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.65446866}, {'id': 'https://openalex.org/C17525397', 'wikidata': 'https://www.wikidata.org/wiki/Q176140', 'display_name': 'Electrode', 'level': 2, 'score': 0.64651227}, {'id': 'https://openalex.org/C5408304', 'wikidata': 'https://www.wikidata.org/wiki/Q5357978', 'display_name': 'Electrochemical scanning tunneling microscope', 'level': 4, 'score': 0.6093371}, {'id': 'https://openalex.org/C58312451', 'wikidata': 'https://www.wikidata.org/wiki/Q4817200', 'display_name': 'Atom (system on chip)', 'level': 2, 'score': 0.60525143}, {'id': 'https://openalex.org/C36628996', 'wikidata': 'https://www.wikidata.org/wiki/Q907287', 'display_name': 'Scanning probe microscopy', 'level': 2, 'score': 0.53388375}, {'id': 'https://openalex.org/C16876290', 'wikidata': 'https://www.wikidata.org/wiki/Q757649', 'display_name': 'Atom probe', 'level': 3, 'score': 0.5296896}, {'id': 'https://openalex.org/C67649825', 'wikidata': 'https://www.wikidata.org/wiki/Q196538', 'display_name': 'Microscope', 'level': 2, 'score': 0.47623116}, {'id': 'https://openalex.org/C113196181', 'wikidata': 'https://www.wikidata.org/wiki/Q485223', 'display_name': 'Analytical Chemistry (journal)', 'level': 2, 'score': 0.40869892}, {'id': 'https://openalex.org/C194577767', 'wikidata': 'https://www.wikidata.org/wiki/Q1651687', 'display_name': 'Scanning tunneling spectroscopy', 'level': 3, 'score': 0.39611858}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.3911227}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.34782502}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.32729468}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.18073842}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.13816124}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.1035274}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.0800958}, {'id': 'https://openalex.org/C149635348', 'wikidata': 'https://www.wikidata.org/wiki/Q193040', 'display_name': 'Embedded system', 'level': 1, 'score': 0.06574726}, {'id': 'https://openalex.org/C146088050', 'wikidata': 'https://www.wikidata.org/wiki/Q744818', 'display_name': 'Transmission electron microscopy', 'level': 2, 'score': 0.051903546}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C43617362', 'wikidata': 'https://www.wikidata.org/wiki/Q170050', 'display_name': 'Chromatography', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/ivmc.1995.487101', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W435361125', 'https://openalex.org/W2976399150', 'https://openalex.org/W2736483163', 'https://openalex.org/W2079253054', 'https://openalex.org/W2078095192', 'https://openalex.org/W2071339353', 'https://openalex.org/W2023274000', 'https://openalex.org/W2021726762', 'https://openalex.org/W2007997200', 'https://openalex.org/W2004379973'], 'abstract_inverted_index': {'The': [0, 23], 'scanning': [1, 61, 67], 'atom': [2], 'probe': [3], '(SAP)': [4], 'was': [5, 53], 'proposed': [6], 'to': [7, 37, 73], 'realize': [8], 'atom-by-atom': [9], 'mass': [10], 'analysis': [11], 'of': [12, 26, 33, 78], 'a': [13, 34, 50, 57, 66], 'flat': [14], 'specimen': [15, 45], 'surface': [16], 'with': [17, 65], 'micro-tip': [18], 'arrays': [19], 'or': [20], 'many': [21], 'microcusps.': [22], 'unique': [24], 'feature': [25], 'the': [27, 31, 38, 44, 75, 79, 82], 'SAP': [28, 52], 'is': [29], 'in': [30, 71], 'introduction': [32], 'microextraction': [35], 'electrode': [36], 'conventional': [39], 'atom-probe': [40], 'which': [41], 'scans': [42], 'over': [43], 'surface.': [46], 'In': [47], 'this': [48], 'paper': [49], 'trial': [51], 'constructed': [54], 'by': [55], 'modifying': [56], 'low': [58], 'temperature': [59], 'UHV': [60], 'tunneling': [62], 'microscope': [63, 69], '(STM)': [64], 'electron': [68], '(SEM)': [70], 'order': [72], 'inspect': [74], 'relative': [76], 'position': [77], 'tip': [80], 'and': [81], 'electrode.': [83]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1537174958', 'counts_by_year': [], 'updated_date': '2024-12-14T11:23:41.751491', 'created_date': '2016-06-24'}