Abstract: Yield prediction is one of the most important topics in semiconductor manufacturing. Especiall y, for a fast-changing environment of the semiconductor industry, efficient forecasting techniq ues are required. In this study, we propose a procedure to predict wafer yield using classificat ion algorithms. The proposed procedure addresses imbalance problems frequently encountered in semiconductor processes so as to construct reliable prediction models. The effectiveness and applicability of the proposed procedure was demonstrated through a real data from a leading semiconductor industry in South Korea.
Publication Year: 2014
Publication Date: 2014-11-01
Language: en
Type: article
Access and Citation
AI Researcher Chatbot
Get quick answers to your questions about the article from our AI researcher chatbot