Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W1503778604', 'doi': 'https://doi.org/10.1116/1.582098', 'title': 'Growth and characterization of Ba0.6Sr0.4TiO3 thin films on Si with Pt electrodes', 'display_name': 'Growth and characterization of Ba0.6Sr0.4TiO3 thin films on Si with Pt electrodes', 'publication_year': 1999, 'publication_date': '1999-07-01', 'ids': {'openalex': 'https://openalex.org/W1503778604', 'doi': 'https://doi.org/10.1116/1.582098', 'mag': '1503778604'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1116/1.582098', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4210190837', 'display_name': 'Journal of Vacuum Science & Technology A Vacuum Surfaces and Films', 'issn_l': '0734-2101', 'issn': ['0734-2101', '1520-8559'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320257', 'host_organization_name': 'American Institute of Physics', 'host_organization_lineage': ['https://openalex.org/P4310320257'], 'host_organization_lineage_names': ['American Institute of Physics'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5084345239', 'display_name': 'Lisa R. Kinder', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1343871089', 'display_name': 'Los Alamos National Laboratory', 'ror': 'https://ror.org/01e41cf67', 'country_code': 'US', 'type': 'facility', 'lineage': ['https://openalex.org/I1330989302', 'https://openalex.org/I1343871089', 'https://openalex.org/I198811213', 'https://openalex.org/I4210120050']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'L. Kinder', 'raw_affiliation_strings': ['Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545'], 'affiliations': [{'raw_affiliation_string': 'Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545', 'institution_ids': ['https://openalex.org/I1343871089']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5062662458', 'display_name': 'X. F. Zhang', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1343871089', 'display_name': 'Los Alamos National Laboratory', 'ror': 'https://ror.org/01e41cf67', 'country_code': 'US', 'type': 'facility', 'lineage': ['https://openalex.org/I1330989302', 'https://openalex.org/I1343871089', 'https://openalex.org/I198811213', 'https://openalex.org/I4210120050']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'X. F. Zhang', 'raw_affiliation_strings': ['Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545'], 'affiliations': [{'raw_affiliation_string': 'Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545', 'institution_ids': ['https://openalex.org/I1343871089']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5025014253', 'display_name': 'I. L. Grigorov', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1343871089', 'display_name': 'Los Alamos National Laboratory', 'ror': 'https://ror.org/01e41cf67', 'country_code': 'US', 'type': 'facility', 'lineage': ['https://openalex.org/I1330989302', 'https://openalex.org/I1343871089', 'https://openalex.org/I198811213', 'https://openalex.org/I4210120050']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'I. L. Grigorov', 'raw_affiliation_strings': ['Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545'], 'affiliations': [{'raw_affiliation_string': 'Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545', 'institution_ids': ['https://openalex.org/I1343871089']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5063221061', 'display_name': 'C. Kwon', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1343871089', 'display_name': 'Los Alamos National Laboratory', 'ror': 'https://ror.org/01e41cf67', 'country_code': 'US', 'type': 'facility', 'lineage': ['https://openalex.org/I1330989302', 'https://openalex.org/I1343871089', 'https://openalex.org/I198811213', 'https://openalex.org/I4210120050']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'C. Kwon', 'raw_affiliation_strings': ['Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545'], 'affiliations': [{'raw_affiliation_string': 'Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545', 'institution_ids': ['https://openalex.org/I1343871089']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5010405864', 'display_name': 'Q. X. Jia', 'orcid': 'https://orcid.org/0000-0002-7683-5202'}, 'institutions': [{'id': 'https://openalex.org/I1343871089', 'display_name': 'Los Alamos National Laboratory', 'ror': 'https://ror.org/01e41cf67', 'country_code': 'US', 'type': 'facility', 'lineage': ['https://openalex.org/I1330989302', 'https://openalex.org/I1343871089', 'https://openalex.org/I198811213', 'https://openalex.org/I4210120050']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Q. X. Jia', 'raw_affiliation_strings': ['Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545'], 'affiliations': [{'raw_affiliation_string': 'Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico\u200987545', 'institution_ids': ['https://openalex.org/I1343871089']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5007070294', 'display_name': 'L. Luo', 'orcid': 'https://orcid.org/0000-0003-0541-1450'}, 'institutions': [{'id': 'https://openalex.org/I193427800', 'display_name': 'Applied Materials (United States)', 'ror': 'https://ror.org/04h1q4c89', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I193427800']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'L. Luo', 'raw_affiliation_strings': ['High k Strategic Product Unit, PDD Product Business Group, Applied Materials, Incorporated, Santa Clara, California\u200995054'], 'affiliations': [{'raw_affiliation_string': 'High k Strategic Product Unit, PDD Product Business Group, Applied Materials, Incorporated, Santa Clara, California\u200995054', 'institution_ids': ['https://openalex.org/I193427800']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5042488609', 'display_name': 'Jijie Zhao', 'orcid': 'https://orcid.org/0000-0002-3917-7060'}, 'institutions': [{'id': 'https://openalex.org/I193427800', 'display_name': 'Applied Materials (United States)', 'ror': 'https://ror.org/04h1q4c89', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I193427800']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'J. Zhao', 'raw_affiliation_strings': ['High k Strategic Product Unit, PDD Product Business Group, Applied Materials, Incorporated, Santa Clara, California\u200995054'], 'affiliations': [{'raw_affiliation_string': 'High k Strategic Product Unit, PDD Product Business Group, Applied Materials, Incorporated, Santa Clara, California\u200995054', 'institution_ids': ['https://openalex.org/I193427800']}]}], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 1.06, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 6, 'citation_normalized_percentile': {'value': 0.435054, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 73, 'max': 75}, 'biblio': {'volume': '17', 'issue': '4', 'first_page': '2148', 'last_page': '2150'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10107', 'display_name': 'Lead-free Piezoelectric Materials', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10107', 'display_name': 'Lead-free Piezoelectric Materials', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10472', 'display_name': 'Atomic Layer Deposition Technology', 'score': 0.9998, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12588', 'display_name': 'Emergent Phenomena at Oxide Interfaces', 'score': 0.9977, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/thin-film-growth', 'display_name': 'Thin Film Growth', 'score': 0.605692}, {'id': 'https://openalex.org/keywords/deposition', 'display_name': 'Deposition (geology)', 'score': 0.60147446}, {'id': 'https://openalex.org/keywords/thin-film-ferroelectrics', 'display_name': 'Thin Film Ferroelectrics', 'score': 0.558346}, {'id': 'https://openalex.org/keywords/pulsed-laser-deposition', 'display_name': 'Pulsed Laser Deposition', 'score': 0.548435}, {'id': 'https://openalex.org/keywords/high-k-dielectrics', 'display_name': 'High-k Dielectrics', 'score': 0.500404}], 'concepts': [{'id': 'https://openalex.org/C46275449', 'wikidata': 'https://www.wikidata.org/wiki/Q2458815', 'display_name': 'Crystallinity', 'level': 2, 'score': 0.80134416}, {'id': 'https://openalex.org/C133386390', 'wikidata': 'https://www.wikidata.org/wiki/Q184996', 'display_name': 'Dielectric', 'level': 2, 'score': 0.7992696}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.7622845}, {'id': 'https://openalex.org/C57410435', 'wikidata': 'https://www.wikidata.org/wiki/Q505668', 'display_name': 'Chemical vapor deposition', 'level': 2, 'score': 0.74786454}, {'id': 'https://openalex.org/C19067145', 'wikidata': 'https://www.wikidata.org/wiki/Q1137203', 'display_name': 'Thin film', 'level': 2, 'score': 0.73798954}, {'id': 'https://openalex.org/C37982897', 'wikidata': 'https://www.wikidata.org/wiki/Q901321', 'display_name': 'Pulsed laser deposition', 'level': 3, 'score': 0.68122554}, {'id': 'https://openalex.org/C17525397', 'wikidata': 'https://www.wikidata.org/wiki/Q176140', 'display_name': 'Electrode', 'level': 2, 'score': 0.67989475}, {'id': 'https://openalex.org/C64297162', 'wikidata': 'https://www.wikidata.org/wiki/Q1987070', 'display_name': 'Deposition (geology)', 'level': 3, 'score': 0.60147446}, {'id': 'https://openalex.org/C2779227376', 'wikidata': 'https://www.wikidata.org/wiki/Q6505497', 'display_name': 'Layer (electronics)', 'level': 2, 'score': 0.59700185}, {'id': 'https://openalex.org/C52192207', 'wikidata': 'https://www.wikidata.org/wiki/Q5322', 'display_name': 'Capacitor', 'level': 3, 'score': 0.55212253}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.47829968}, {'id': 'https://openalex.org/C183866003', 'wikidata': 'https://www.wikidata.org/wiki/Q515503', 'display_name': 'Combustion chemical vapor deposition', 'level': 4, 'score': 0.4601605}, {'id': 'https://openalex.org/C175665537', 'wikidata': 'https://www.wikidata.org/wiki/Q1924991', 'display_name': 'Metalorganic vapour phase epitaxy', 'level': 4, 'score': 0.43272603}, {'id': 'https://openalex.org/C113196181', 'wikidata': 'https://www.wikidata.org/wiki/Q485223', 'display_name': 'Analytical Chemistry (journal)', 'level': 2, 'score': 0.3731782}, {'id': 'https://openalex.org/C75937256', 'wikidata': 'https://www.wikidata.org/wiki/Q1440781', 'display_name': 'Carbon film', 'level': 3, 'score': 0.3673164}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.24695009}, {'id': 'https://openalex.org/C110738630', 'wikidata': 'https://www.wikidata.org/wiki/Q1135540', 'display_name': 'Epitaxy', 'level': 3, 'score': 0.24452841}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.22318122}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.13023725}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.094433784}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.059921592}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C151730666', 'wikidata': 'https://www.wikidata.org/wiki/Q7205', 'display_name': 'Paleontology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C43617362', 'wikidata': 'https://www.wikidata.org/wiki/Q170050', 'display_name': 'Chromatography', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C2816523', 'wikidata': 'https://www.wikidata.org/wiki/Q180184', 'display_name': 'Sediment', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C86803240', 'wikidata': 'https://www.wikidata.org/wiki/Q420', 'display_name': 'Biology', 'level': 0, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1116/1.582098', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4210190837', 'display_name': 'Journal of Vacuum Science & Technology A Vacuum Surfaces and Films', 'issn_l': '0734-2101', 'issn': ['0734-2101', '1520-8559'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320257', 'host_organization_name': 'American Institute of Physics', 'host_organization_lineage': ['https://openalex.org/P4310320257'], 'host_organization_lineage_names': ['American Institute of Physics'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 8, 'referenced_works': ['https://openalex.org/W1493714178', 'https://openalex.org/W1527540762', 'https://openalex.org/W1732105409', 'https://openalex.org/W1982726157', 'https://openalex.org/W1991826204', 'https://openalex.org/W2021096287', 'https://openalex.org/W2038590128', 'https://openalex.org/W2977406220'], 'related_works': ['https://openalex.org/W2275674231', 'https://openalex.org/W2160856925', 'https://openalex.org/W2093834094', 'https://openalex.org/W2085568772', 'https://openalex.org/W2085457808', 'https://openalex.org/W2080259365', 'https://openalex.org/W2050628913', 'https://openalex.org/W2046738284', 'https://openalex.org/W2007749909', 'https://openalex.org/W1981715745'], 'abstract_inverted_index': {'Both': [0], 'metalorganic': [1, 83], 'chemical': [2, 84], 'vapor': [3, 85], 'deposition': [4, 8, 86], 'and': [5, 52], 'pulsed': [6, 96], 'laser': [7, 97], 'have': [9], 'been': [10], 'used': [11], 'to': [12, 30], 'grow': [13, 31], 'Ba0.6Sr0.4TiO3': [14], '(BST)': [15], 'thin': [16], 'films': [17, 69], 'on': [18], 'Si': [19], 'with': [20, 32, 39], 'Pt': [21, 25], 'electrodes.': [22], 'The': [23, 63], 'smoother': [24], 'electrodes': [26], 'allow': [27], 'the': [28, 56, 67], 'BST': [29, 68, 79, 92], 'greater': [33], 'crystallinity.': [34], 'Thin': [35], 'film': [36], 'Pt/BST/Pt': [37], 'capacitors': [38], 'a': [40, 76, 89], 'dielectric': [41, 48, 53], 'thickness': [42], 'of': [43, 58, 66], 'around': [44], '170': [45], 'nm': [46, 78, 91], 'show': [47], 'constants': [49], 'over': [50], '400': [51], 'losses': [54], 'in': [55], 'range': [57], '0.01–0.03': [59], 'at': [60], '10': [61], 'kHz.': [62], 'electric/dielectric': [64], 'properties': [65], 'are': [70], 'further': [71], 'improved': [72], 'by': [73, 82, 88, 95], 'first': [74], 'depositing': [75], '27': [77], 'seed': [80], 'layer': [81, 93], 'followed': [87], '145': [90], 'deposited': [94], 'deposition.': [98]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1503778604', 'counts_by_year': [{'year': 2012, 'cited_by_count': 2}], 'updated_date': '2024-09-10T08:39:23.129862', 'created_date': '2016-06-24'}