Title: Dot Based Image Analysis Using Local Binary Pattern and Genetic Algorithm
Abstract: Analysis and matching of Dot Patterns is necessary for many of the image analysis and pattern recognition problems. The paper has stated and used local binary pattern for extracting the Dot pattern image features. It has also stated that only the more discriminated features can be retained by discarding the less discriminated features using Genetic Algorithm. The optimized features obtained can be used for matching the dot patterns using Euclidean Distance.
Publication Year: 2013
Publication Date: 2013-01-01
Language: en
Type: book-chapter
Indexed In: ['crossref']
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