Title: Phase Imaging: A Compressive Sensing Approach
Abstract: Journal Article Phase Imaging: A Compressive Sensing Approach Get access Sebastian Schneider, Sebastian Schneider IFW Dresden, Institute for Metallic Materials, Dresden, GermanyTU Dresden, Institute of Solid State Physics, Dresden, Germany Search for other works by this author on: Oxford Academic Google Scholar Andrew Stevens, Andrew Stevens Pacific Northwest National Laboratory, Richland, Washington, USADuke University, Electrical and Computer Engineering, Durham, North Carolina, USA Search for other works by this author on: Oxford Academic Google Scholar Nigel D Browning, Nigel D Browning Pacific Northwest National Laboratory, Richland, Washington, USAUniversity of Washington, Materials Science and Engineering, Seattle, Washington, USA Search for other works by this author on: Oxford Academic Google Scholar Darius Pohl, Darius Pohl IFW Dresden, Institute for Metallic Materials, Dresden, Germany Search for other works by this author on: Oxford Academic Google Scholar Kornelius Nielsch, Kornelius Nielsch IFW Dresden, Institute for Metallic Materials, Dresden, GermanyTU Dresden, Institute of Materials Science, Dresden, Germany Search for other works by this author on: Oxford Academic Google Scholar Bernd Rellinghaus Bernd Rellinghaus IFW Dresden, Institute for Metallic Materials, Dresden, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 94–95, https://doi.org/10.1017/S1431927617001155 Published: 04 August 2017