Title: Half-sib progeny test and early selection of the 2~(nd) generation seed orchard for Cunninghamia lanceolata
Abstract: To provide technical basis for construction of high-generation seed orchard,progeny test was conducted by using half-sib progenies of the 2nd generation seed orchard of Cunninghamia lanceolata on National Forest Farm in Sha-xian,Fujian province.The results showed that there were genetic differences among families in growth and preservation rate.And the differences were controlled by genetic factors,moderately or lower.By contrast,more genetic gain would be got if volume other than tree height and DBH was used as the selection index.Six superior families and 12 superior individuals were selected based on data of four consecutive years.During the the same period,nine poor families were selected in the 2nd generation seed orchard for thinning cut to improve the seed orchard.This study provides a meaningful technique for the construction of high-generation seed orchard.
Publication Year: 2011
Publication Date: 2011-01-01
Language: en
Type: article
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