Title: Impact of Interfacial Microstructure on Charge Carrier Transport in Solution‐Processed Conjugated Polymer Field‐Effect Transistors
Abstract: Advanced MaterialsVolume 28, Issue 11 p. 2245-2252 Communication Impact of Interfacial Microstructure on Charge Carrier Transport in Solution-Processed Conjugated Polymer Field-Effect Transistors Mengmeng Li, Mengmeng Li Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanySearch for more papers by this authorCunbin An, Cunbin An Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanySearch for more papers by this authorTomasz Marszalek, Tomasz Marszalek Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanySearch for more papers by this authorMartin Baumgarten, Martin Baumgarten Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanySearch for more papers by this authorKlaus Müllen, Corresponding Author Klaus Müllen Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanyE-mail: [email protected], [email protected]Search for more papers by this authorWojciech Pisula, Corresponding Author Wojciech Pisula Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany Department of Molecular Physics, Faculty of Chemistry, Lodz University of Technology, Zeromskiego 116, 90-924 Lodz, PolandE-mail: [email protected], [email protected]Search for more papers by this author Mengmeng Li, Mengmeng Li Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanySearch for more papers by this authorCunbin An, Cunbin An Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanySearch for more papers by this authorTomasz Marszalek, Tomasz Marszalek Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanySearch for more papers by this authorMartin Baumgarten, Martin Baumgarten Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanySearch for more papers by this authorKlaus Müllen, Corresponding Author Klaus Müllen Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, GermanyE-mail: [email protected], [email protected]Search for more papers by this authorWojciech Pisula, Corresponding Author Wojciech Pisula Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany Department of Molecular Physics, Faculty of Chemistry, Lodz University of Technology, Zeromskiego 116, 90-924 Lodz, PolandE-mail: [email protected], [email protected]Search for more papers by this author First published: 14 January 2016 https://doi.org/10.1002/adma.201503552Citations: 56Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Graphical Abstract The surface roughness of a dielectric is precisely tuned, allowing a fine control solely over the interfacial microstructure in a semicrystalline semiconductor polymer film without affecting the morphology in the upper layers. The interfacial microstructure is found to have only a minor impact on the transport originating from bypassing of interfacial defects by the charge carriers. Supporting Information As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. 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Publication Year: 2016
Publication Date: 2016-01-14
Language: en
Type: article
Indexed In: ['crossref', 'pubmed']
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Cited By Count: 60
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