Title: A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope
Abstract: Journal Article A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope Get access Knut Urban, Knut Urban * 1Institut für FestkörperforschungForschungszentrum Jülich GmbH, D-52425 Jülich *To whom correspondence should be addressed Search for other works by this author on: Oxford Academic PubMed Google Scholar Bernd Kabius, Bernd Kabius 1Institut für FestkörperforschungForschungszentrum Jülich GmbH, D-52425 Jülich Search for other works by this author on: Oxford Academic PubMed Google Scholar Max Haider, Max Haider 2CEOS GmbHIm Neuenheimer Feld 519, D-69 120 Heidelberg Search for other works by this author on: Oxford Academic PubMed Google Scholar Harald Rose Harald Rose 3Institute für Angewandte Physik, Technische Hochschule DarmstadtD-64289 Darmstadt, Germany Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 48, Issue 6, 1999, Pages 821–826, https://doi.org/10.1093/oxfordjournals.jmicro.a023753 Published: 01 January 1999 Article history Published: 01 January 1999 Received: 23 March 1999 Accepted: 23 September 1999
Publication Year: 1999
Publication Date: 1999-01-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 57
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