Title: Micro architecture coverage directed generation of test programs
Abstract: Article Free Access Share on Micro architecture coverage directed generation of test programs Authors: Shmuel Ur IBM Haifa Research Lab IBM Haifa Research LabView Profile , Yaov Yadin IBM Haifa Research Lab IBM Haifa Research LabView Profile Authors Info & Claims DAC '99: Proceedings of the 36th annual ACM/IEEE Design Automation ConferenceJune 1999Pages 175–180https://doi.org/10.1145/309847.309909Published:01 June 1999Publication History 56citation464DownloadsMetricsTotal Citations56Total Downloads464Last 12 Months57Last 6 weeks6 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF