Publication Information

{'id': 'https://openalex.org/W2046213390', 'doi': 'https://doi.org/10.1109/arftg.1993.327040', 'title': 'Verification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates', 'display_name': 'Verification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates', 'publication_year': 1993, 'publication_date': '1993-12-01', 'ids': {'openalex': 'https://openalex.org/W2046213390', 'doi': 'https://doi.org/10.1109/arftg.1993.327040', 'mag': '2046213390'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/arftg.1993.327040', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5028984250', 'display_name': 'J. Pence', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I76705860', 'display_name': 'Cascade Microtech (United States)', 'ror': 'https://ror.org/0401b3q74', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I76705860']}], 'countries': ['US'], 'is_corresponding': True, 'raw_author_name': 'J. E. Pence', 'raw_affiliation_strings': ['Cascade Microtech, 14255 SW Brigadoon Ct., Beaverton, OR 97005'], 'affiliations': [{'raw_affiliation_string': 'Cascade Microtech, 14255 SW Brigadoon Ct., Beaverton, OR 97005', 'institution_ids': ['https://openalex.org/I76705860']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': ['https://openalex.org/A5028984250'], 'corresponding_institution_ids': ['https://openalex.org/I76705860'], 'apc_list': None, 'apc_paid': None, 'fwci': 1.412, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 12, 'citation_normalized_percentile': {'value': 0.95444, 'is_in_top_1_percent': False, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 79, 'max': 80}, 'biblio': {'volume': None, 'issue': None, 'first_page': None, 'last_page': None}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11607', 'display_name': 'Microwave Sensors for Material Characterization and Sensing', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11607', 'display_name': 'Microwave Sensors for Material Characterization and Sensing', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10187', 'display_name': 'Radio Frequency Integrated Circuit Design', 'score': 0.9989, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10262', 'display_name': 'Microwave Engineering and Waveguides', 'score': 0.9989, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/nist', 'display_name': 'NIST', 'score': 0.980217}, {'id': 'https://openalex.org/keywords/repeatability', 'display_name': 'Repeatability', 'score': 0.59148085}, {'id': 'https://openalex.org/keywords/coplanar-waveguide', 'display_name': 'Coplanar waveguide', 'score': 0.5577072}, {'id': 'https://openalex.org/keywords/millimeter-wave-applications', 'display_name': 'Millimeter-Wave Applications', 'score': 0.502155}, {'id': 'https://openalex.org/keywords/substrate-integrated-waveguide', 'display_name': 'Substrate Integrated Waveguide', 'score': 0.501122}], 'concepts': [{'id': 'https://openalex.org/C111219384', 'wikidata': 'https://www.wikidata.org/wiki/Q6954384', 'display_name': 'NIST', 'level': 2, 'score': 0.980217}, {'id': 'https://openalex.org/C165838908', 'wikidata': 'https://www.wikidata.org/wiki/Q736777', 'display_name': 'Calibration', 'level': 2, 'score': 0.8520764}, {'id': 'https://openalex.org/C2780023022', 'wikidata': 'https://www.wikidata.org/wiki/Q1338171', 'display_name': 'Compensation (psychology)', 'level': 2, 'score': 0.71314156}, {'id': 'https://openalex.org/C29210110', 'wikidata': 'https://www.wikidata.org/wiki/Q177897', 'display_name': 'Inductance', 'level': 3, 'score': 0.628848}, {'id': 'https://openalex.org/C154020017', 'wikidata': 'https://www.wikidata.org/wiki/Q520171', 'display_name': 'Repeatability', 'level': 2, 'score': 0.59148085}, {'id': 'https://openalex.org/C3736036', 'wikidata': 'https://www.wikidata.org/wiki/Q15525941', 'display_name': 'Coplanar waveguide', 'level': 3, 'score': 0.5577072}, {'id': 'https://openalex.org/C44838205', 'wikidata': 'https://www.wikidata.org/wiki/Q127995', 'display_name': 'Microwave', 'level': 2, 'score': 0.51390505}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.5021291}, {'id': 'https://openalex.org/C183115368', 'wikidata': 'https://www.wikidata.org/wiki/Q856577', 'display_name': 'Weighting', 'level': 2, 'score': 0.46888706}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.46798775}, {'id': 'https://openalex.org/C137209882', 'wikidata': 'https://www.wikidata.org/wiki/Q1403517', 'display_name': 'Measurement uncertainty', 'level': 2, 'score': 0.45569247}, {'id': 'https://openalex.org/C195766429', 'wikidata': 'https://www.wikidata.org/wiki/Q394', 'display_name': 'Metrology', 'level': 2, 'score': 0.4428584}, {'id': 'https://openalex.org/C160671074', 'wikidata': 'https://www.wikidata.org/wiki/Q267131', 'display_name': 'Wafer', 'level': 2, 'score': 0.44089332}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.30674726}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.23387396}, {'id': 'https://openalex.org/C24890656', 'wikidata': 'https://www.wikidata.org/wiki/Q82811', 'display_name': 'Acoustics', 'level': 1, 'score': 0.17946133}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.16256133}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.13233095}, {'id': 'https://openalex.org/C76155785', 'wikidata': 'https://www.wikidata.org/wiki/Q418', 'display_name': 'Telecommunications', 'level': 1, 'score': 0.12821558}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.1179491}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.10709369}, {'id': 'https://openalex.org/C105795698', 'wikidata': 'https://www.wikidata.org/wiki/Q12483', 'display_name': 'Statistics', 'level': 1, 'score': 0.071729034}, {'id': 'https://openalex.org/C15744967', 'wikidata': 'https://www.wikidata.org/wiki/Q9418', 'display_name': 'Psychology', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C204321447', 'wikidata': 'https://www.wikidata.org/wiki/Q30642', 'display_name': 'Natural language processing', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C11171543', 'wikidata': 'https://www.wikidata.org/wiki/Q41630', 'display_name': 'Psychoanalysis', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/arftg.1993.327040', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 3, 'referenced_works': ['https://openalex.org/W2026249773', 'https://openalex.org/W2032203172', 'https://openalex.org/W2537495340'], 'related_works': ['https://openalex.org/W3015838480', 'https://openalex.org/W2807901368', 'https://openalex.org/W2606392311', 'https://openalex.org/W2158491338', 'https://openalex.org/W2133733652', 'https://openalex.org/W2092690554', 'https://openalex.org/W2085553943', 'https://openalex.org/W2072658171', 'https://openalex.org/W2071344495', 'https://openalex.org/W1980429525'], 'abstract_inverted_index': {'The': [0, 77], 'microwave': [1], 'on-wafer': [2], 'measurement': [3], 'community': [4], 'has': [5, 26], 'been': [6], 'searching': [7], 'for': [8], 'a': [9, 37], 'mechanism': [10], 'to': [11, 87], 'quantify': [12], 'calibration': [13, 31], 'inaccuracies.': [14], 'Recent': [15], 'work': [16], 'at': [17], 'the': [18, 28, 42, 90, 94, 97], 'National': [19], 'Institute': [20], 'of': [21, 30, 50, 96], 'Standards': [22], 'and': [23, 83, 93], 'Technology': [24], '(NIST)': [25], 'enabled': [27], 'determination': [29], 'error': [32, 79], 'bounds': [33, 80], 'by': [34], 'comparison': [35], 'with': [36, 55, 73], 'well': [38], 'understood': [39], 'technique': [40], '-': [41], 'NIST': [43, 75], 'multi-line': [44], 'GaAs': [45], 'TRL': [46], 'calibration.': [47, 76], 'A': [48], 'series': [49], 'automated': [51, 98], 'Line-Reflect-Reflect-Match': [52], '(LRRM)': [53], 'calibrations': [54, 69], 'load': [56], 'inductance': [57], 'compensation': [58], 'were': [59, 70, 81], 'performed': [60], 'on': [61], 'commercially': [62], 'available': [63], 'alumina': [64], 'coplanar': [65], 'waveguide': [66], 'standards.': [67], 'These': [68], 'then': [71], 'compared': [72, 84], 'an': [74], 'calculated': [78], 'determined': [82], 'in': [85], 'order': [86], 'assess': [88], 'both': [89], 'relative': [91], 'accuracy': [92], 'repeatability': [95], 'calibrations.': [99]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2046213390', 'counts_by_year': [{'year': 2021, 'cited_by_count': 2}, {'year': 2019, 'cited_by_count': 1}, {'year': 2017, 'cited_by_count': 1}, {'year': 2016, 'cited_by_count': 1}, {'year': 2014, 'cited_by_count': 1}], 'updated_date': '2024-09-24T19:34:44.523712', 'created_date': '2016-06-24'}