Title: Wavelet OHIF Elman neural network model and its predictive control of processing quality
Abstract: There are some difficulties in build the process quality prediction model based on Elman neural network. The traditional Sigmoid activation function often used in the hidden layer, while it is difficult to establish a quantitative relationship between the network size and resolution scale, therefore, a wavelet OHIF Elman neural network model is proposed in this paper, which full use of the neural network weights of the linear distribution and learning convex objective function, so it can avoid the local optimal nonlinear optimization problems. Simulation results show that the wavelet Elman OHIF Elman network decreased 12.9 percent compared with OHIF Elman network which used the sigmoid activation function in hidden layer.
Publication Year: 2010
Publication Date: 2010-12-26
Language: en
Type: article
Indexed In: ['crossref']
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